Matrix Codes: Multiple Bit Upsets Tolerant Method for SRAM Memories. [Citation Graph (, )][DBLP]
Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement. [Citation Graph (, )][DBLP]
A fast error correction technique for matrix multiplication algorithms. [Citation Graph (, )][DBLP]
Increasing memory yield in future technologies through innovative design. [Citation Graph (, )][DBLP]
Area Reliability Trade-Off in Improved Reed Muller Coding. [Citation Graph (, )][DBLP]
A soft error robust and power aware memory design. [Citation Graph (, )][DBLP]
Reliability aware yield improvement technique for nanotechnology based circuits. [Citation Graph (, )][DBLP]
Single Error Correcting Finite Field Multipliers Over GF(2m). [Citation Graph (, )][DBLP]
Algorithm Level Fault Tolerance: A Technique to Cope with Long Duration Transient Faults in Matrix Multiplication Algorithms. [Citation Graph (, )][DBLP]
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