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Christopher S. Taillefer:
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- Christopher S. Taillefer, Gordon W. Roberts
Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment without Increasing Test Time. [Citation Graph (0, 0)][DBLP] ITC, 2004, pp:953-962 [Conf]
- Christopher S. Taillefer, Gordon W. Roberts
Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment Without Increasing Test Time. [Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2005, v:13, n:7, pp:852-860 [Journal]
- Christopher S. Taillefer, Gordon W. Roberts
Delta-Sigma Analog-to-Digital Conversion via Time-Mode Signal Processing. [Citation Graph (0, 0)][DBLP] ISCAS, 2007, pp:13-16 [Conf]
- Christopher S. Taillefer, Gordon W. Roberts
Process-insensitive modulated-clock voltage comparator. [Citation Graph (0, 0)][DBLP] ISCAS, 2006, pp:- [Conf]
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