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Hiroki Wada:
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Publications of Author
- Satoshi Ohtake, Shintaro Nagai, Hiroki Wada, Hideo Fujiwara
A DFT method for RTL circuits to achieve complete fault efficiency based on fixed-control testability. [Citation Graph (0, 0)][DBLP] ASP-DAC, 2001, pp:331-334 [Conf]
- Satoshi Ohtake, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara
A non-scan DFT method at register-transfer level to achieve complete fault efficiency. [Citation Graph (0, 0)][DBLP] ASP-DAC, 2000, pp:599-604 [Conf]
- Toshimitsu Masuzawa, Minoru Izutsu, Hiroki Wada, Hideo Fujiwara
Single-control testability of RTL data paths for BIST. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2000, pp:210-215 [Conf]
- Ken-ichi Yamaguchi, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara
BIST Method Based on Concurrent Single-Control Testability of RTL Data Paths. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2001, pp:313-318 [Conf]
- Hiroki Wada, Toshimitsu Masuzawa, Kewal K. Saluja, Hideo Fujiwara
Design for Strong Testability of RTL Data Paths to Provide Complete Fault Efficiency. [Citation Graph (0, 0)][DBLP] VLSI Design, 2000, pp:300-305 [Conf]
A 2.8-V Multibit Complex Bandpass Delta-Sigma-AD Modulator in 0.18µm CMOS. [Citation Graph (, )][DBLP]
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