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Hiroki Wada: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Satoshi Ohtake, Shintaro Nagai, Hiroki Wada, Hideo Fujiwara
    A DFT method for RTL circuits to achieve complete fault efficiency based on fixed-control testability. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2001, pp:331-334 [Conf]
  2. Satoshi Ohtake, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara
    A non-scan DFT method at register-transfer level to achieve complete fault efficiency. [Citation Graph (0, 0)][DBLP]
    ASP-DAC, 2000, pp:599-604 [Conf]
  3. Toshimitsu Masuzawa, Minoru Izutsu, Hiroki Wada, Hideo Fujiwara
    Single-control testability of RTL data paths for BIST. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2000, pp:210-215 [Conf]
  4. Ken-ichi Yamaguchi, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara
    BIST Method Based on Concurrent Single-Control Testability of RTL Data Paths. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:313-318 [Conf]
  5. Hiroki Wada, Toshimitsu Masuzawa, Kewal K. Saluja, Hideo Fujiwara
    Design for Strong Testability of RTL Data Paths to Provide Complete Fault Efficiency. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2000, pp:300-305 [Conf]

  6. A 2.8-V Multibit Complex Bandpass Delta-Sigma-AD Modulator in 0.18µm CMOS. [Citation Graph (, )][DBLP]


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