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Sagar S. Sabade :
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Sagar S. Sabade , Hank Walker Evaluation of Statistical Outlier Rejection Methods for IDDQ Limit Setting. [Citation Graph (0, 0)][DBLP ] ASP-DAC, 2002, pp:755-760 [Conf ] Sagar S. Sabade , D. M. H. Walker Neighbor Current Ratio (NCR): A New Metric for IDDQ Data Analysis. [Citation Graph (0, 0)][DBLP ] DFT, 2002, pp:381-389 [Conf ] Sagar S. Sabade , D. M. H. Walker CROWNE: Current Ratio Outliers with Neighbor Estimator. [Citation Graph (0, 0)][DBLP ] DFT, 2003, pp:132-139 [Conf ] Sagar S. Sabade , D. M. H. Walker Improved wafer-level spatial analysis for I_DDQ limit setting. [Citation Graph (0, 0)][DBLP ] ITC, 2001, pp:82-91 [Conf ] Sagar S. Sabade , D. M. H. Walker Evaluation of Statistical Outlier Rejection Methods for IDDQ Limit Setting. [Citation Graph (0, 0)][DBLP ] VLSI Design, 2002, pp:755-760 [Conf ] Sagar S. Sabade , D. M. H. Walker Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification. [Citation Graph (0, 0)][DBLP ] VLSI Design, 2003, pp:361-0 [Conf ] Sagar S. Sabade , D. M. H. Walker Comparison of Effectiveness of Current Ratio and Delta-IDDQ Tests. [Citation Graph (0, 0)][DBLP ] VLSI Design, 2004, pp:889-894 [Conf ] Sagar S. Sabade , D. M. H. Walker Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IDDQ Testing for Burn-in Reduction. [Citation Graph (0, 0)][DBLP ] VTS, 2002, pp:81-86 [Conf ] Sagar S. Sabade , D. M. H. Walker Use of Multiple IDDQ Test Metrics for Outlier Identification. [Citation Graph (0, 0)][DBLP ] VTS, 2003, pp:31-38 [Conf ] Sagar S. Sabade , D. M. H. Walker On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set. [Citation Graph (0, 0)][DBLP ] VTS, 2004, pp:65-72 [Conf ] Sagar S. Sabade , D. M. H. Walker IDDQ Test: Will It Survive the DSM Challenge? [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2002, v:19, n:5, pp:8-16 [Journal ] Sagar S. Sabade , Duncan M. Walker IC Outlier Identification Using Multiple Test Metrics. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2005, v:22, n:6, pp:586-595 [Journal ] Sagar S. Sabade , D. M. H. Walker IDDQ data analysis using neighbor current ratios. [Citation Graph (0, 0)][DBLP ] Journal of Systems Architecture, 2004, v:50, n:5, pp:287-294 [Journal ] Sagar S. Sabade , D. M. H. Walker IDDX -based test methods: A survey. [Citation Graph (0, 0)][DBLP ] ACM Trans. Design Autom. Electr. Syst., 2004, v:9, n:2, pp:159-198 [Journal ] Sagar S. Sabade , D. M. H. Walker Estimation of fault-free leakage current using wafer-level spatial information. [Citation Graph (0, 0)][DBLP ] IEEE Trans. VLSI Syst., 2006, v:14, n:1, pp:91-94 [Journal ] Search in 0.002secs, Finished in 0.002secs