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Andrzej J. Strojwas :
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Andrzej J. Strojwas Design for manufacturability: a path from system level to high yielding chips: embedded tutorial. [Citation Graph (0, 0)][DBLP ] ASP-DAC, 2000, pp:375-376 [Conf ] Jacques Benkoski , Andrzej J. Strojwas Timing Verification by Formal Signal Interaction Modeling in a Multi-level Timing Simulator. [Citation Graph (0, 0)][DBLP ] DAC, 1989, pp:668-673 [Conf ] Jacques Benkoski , Andrzej J. Strojwas The Role of Timing Verification in Layout Synthesis. [Citation Graph (0, 0)][DBLP ] DAC, 1991, pp:612-619 [Conf ] Marko P. Chew , Andrzej J. Strojwas Utilizing Logic Information in Multi-Level Timing Simulation. [Citation Graph (0, 0)][DBLP ] DAC, 1991, pp:215-218 [Conf ] V. Kheterpal , V. Rovner , T. G. Hersan , D. Motiani , Y. Takegawa , Andrzej J. Strojwas , Lawrence T. Pileggi Design methodology for IC manufacturability based on regular logic-bricks. [Citation Graph (0, 0)][DBLP ] DAC, 2005, pp:353-358 [Conf ] V. Kheterpal , Andrzej J. Strojwas , Lawrence T. Pileggi Routing architecture exploration for regular fabrics. [Citation Graph (0, 0)][DBLP ] DAC, 2004, pp:204-207 [Conf ] Vladimir Koval , Igor W. Farmaga , Andrzej J. Strojwas , Stephen W. Director MONSTR: A Complete Thermal Simulator of Electronic Systems. [Citation Graph (0, 0)][DBLP ] DAC, 1994, pp:570-575 [Conf ] Ying Liu , Sani R. Nassif , Lawrence T. Pileggi , Andrzej J. Strojwas Impact of interconnect variations on the clock skew of a gigahertz microprocessor. [Citation Graph (0, 0)][DBLP ] DAC, 2000, pp:168-171 [Conf ] Ying Liu , Lawrence T. Pileggi , Andrzej J. Strojwas ftd : An Exact Frequency to Time Domain Conversion for Reduced Order RLC Interconnect Models. [Citation Graph (0, 0)][DBLP ] DAC, 1998, pp:469-472 [Conf ] Ying Liu , Lawrence T. Pileggi , Andrzej J. Strojwas Model Order-Reduction of RC(L) Interconnect Including Variational Analysis. [Citation Graph (0, 0)][DBLP ] DAC, 1999, pp:201-206 [Conf ] N. S. Nagaraj , Andrzej J. Strojwas , Sani R. Nassif , Ray Hokinson , Tak Young , Wonjae L. Kang , David Overhauser , Sung-Mo Kang When bad things happen to good chips (panel session). [Citation Graph (0, 0)][DBLP ] DAC, 2000, pp:736-737 [Conf ] Lawrence T. Pileggi , Herman Schmit , Andrzej J. Strojwas , Padmini Gopalakrishnan , V. Kheterpal , Aneesh Koorapaty , Chetan Patel , V. Rovner , K. Y. Tong Exploring regular fabrics to optimize the performance-cost trade-off. [Citation Graph (0, 0)][DBLP ] DAC, 2003, pp:782-787 [Conf ] Andrzej J. Strojwas Design for Manufacturability and Yield. [Citation Graph (0, 0)][DBLP ] DAC, 1989, pp:454-459 [Conf ] Andrzej J. Strojwas , Clark Beck , Dennis Buss , Tülin Erdim Mangir , Charles H. Stapper Yield of VLSI circuits: myths vs. reality (panel). [Citation Graph (0, 0)][DBLP ] DAC, 1986, pp:234-235 [Conf ] D. M. H. Walker , Chris S. Kellen , Andrzej J. Strojwas A Semiconductor Wafer Representation Database and Its Use in the PREDITOR Process Editor and Statistical Simulator. [Citation Graph (0, 0)][DBLP ] DAC, 1991, pp:579-584 [Conf ] Yaping Zhan , Andrzej J. Strojwas , Xin Li , Lawrence T. Pileggi , David Newmark , Mahesh Sharma Correlation-aware statistical timing analysis with non-gaussian delay distributions. [Citation Graph (0, 0)][DBLP ] DAC, 2005, pp:77-82 [Conf ] Andrzej J. Strojwas CMU-CAM system. [Citation Graph (0, 0)][DBLP ] DAC, 1985, pp:319-325 [Conf ] Davide Pandini , Lawrence T. Pileggi , Andrzej J. Strojwas Congestion-Aware Logic Synthesis. [Citation Graph (0, 0)][DBLP ] DATE, 2002, pp:664-671 [Conf ] Kimon W. Michaels , Andrzej J. Strojwas Variable Accuracy Device Modeling for Event-Driven Circuit Simulation. [Citation Graph (0, 0)][DBLP ] EDAC-ETC-EUROASIC, 1994, pp:557-561 [Conf ] Mukund Sivaraman , Andrzej J. Strojwas Towards Incorporating Device Parameter Variations in Timing Analysis. [Citation Graph (0, 0)][DBLP ] EDAC-ETC-EUROASIC, 1994, pp:338-342 [Conf ] Davide Pandini , Lawrence T. Pileggi , Andrzej J. Strojwas Bounding the efforts on congestion optimization for physical synthesis. [Citation Graph (0, 0)][DBLP ] ACM Great Lakes Symposium on VLSI, 2003, pp:7-10 [Conf ] Xin Li , Jiayong Le , Lawrence T. Pileggi , Andrzej J. Strojwas Projection-based performance modeling for inter/intra-die variations. [Citation Graph (0, 0)][DBLP ] ICCAD, 2005, pp:721-727 [Conf ] Kimon W. Michaels , Andrzej J. Strojwas A methodology for improved circuit simulation efficiency via topology-based variable accuracy device modeling. [Citation Graph (0, 0)][DBLP ] ICCAD, 1992, pp:254-257 [Conf ] Mukund Sivaraman , Andrzej J. Strojwas Delay fault coverage: a realistic metric and an estimation technique for distributed path delay faults. [Citation Graph (0, 0)][DBLP ] ICCAD, 1996, pp:494-501 [Conf ] Mukund Sivaraman , Andrzej J. Strojwas Timing analysis based on primitive path delay fault identification. [Citation Graph (0, 0)][DBLP ] ICCAD, 1997, pp:182-189 [Conf ] Andrzej J. Strojwas Design-Manufacturing Interface for 0.13 Micron and Below. [Citation Graph (0, 0)][DBLP ] ICCAD, 2000, pp:575- [Conf ] Yaping Zhan , Andrzej J. Strojwas , Mahesh Sharma , David Newmark Statistical critical path analysis considering correlations. [Citation Graph (0, 0)][DBLP ] ICCAD, 2005, pp:699-704 [Conf ] Jin-Qin Lu , Kimihiro Ogawa , Takehiko Adachi , Andrzej J. Strojwas Stochastic Interpolation Model Scheme for Statistical Circuit Design. [Citation Graph (0, 0)][DBLP ] ISCAS, 1994, pp:125-128 [Conf ] Andrzej J. Strojwas , Michele Quarantelli , J. Borel , Carlo Guardiani , G. Nicollini , G. Crisenza , Bruno Franzini , J. Wiart Manufacturability of low power CMOS technology solutions. [Citation Graph (0, 0)][DBLP ] ISLPED, 1996, pp:225-232 [Conf ] Mariusz Niewczas , Wojciech Maly , Andrzej J. Strojwas A pattern matching algorithm for verification and analysis of very large IC layouts. [Citation Graph (0, 0)][DBLP ] ISPD, 1998, pp:129-134 [Conf ] Andrzej J. Strojwas Tutorial on DFM for physical design. [Citation Graph (0, 0)][DBLP ] ISPD, 2005, pp:103- [Conf ] Davide Pandini , Lawrence T. Pileggi , Andrzej J. Strojwas Understanding and addressing the impact of wiring congestion during technology mapping. [Citation Graph (0, 0)][DBLP ] ISPD, 2002, pp:131-136 [Conf ] Carlo Guardiani , Andrzej J. Strojwas Design-Manufacturing Interface in the Deep Submicron: Is Technology Independent Design Dead? [Citation Graph (0, 0)][DBLP ] ISQED, 2000, pp:447-0 [Conf ] Jacques Benkoski , Andrzej J. Strojwas Computation of Delay Defect and Delay Fault Probabilities Using a Statistical Timing Simulator. [Citation Graph (0, 0)][DBLP ] ITC, 1989, pp:153-160 [Conf ] Mukund Sivaraman , Andrzej J. Strojwas Test Vector Generation for Parametric Path Delay Faults. [Citation Graph (0, 0)][DBLP ] ITC, 1995, pp:132-138 [Conf ] Yaping Zhan , Andrzej J. Strojwas , Mahesh Sharma , David Newmark Statistical Critical Path Analysis Considering Correlations. [Citation Graph (0, 0)][DBLP ] PATMOS, 2005, pp:364-373 [Conf ] Marko P. Chew , Sharad Saxena , Thomas F. Cobourn , Purnendu K. Mozumder , Andrzej J. Strojwas A New Methodology for Concurrent Technology Development and Cell Library Optimization. [Citation Graph (0, 0)][DBLP ] VLSI Design, 1999, pp:18-25 [Conf ] Mukund Sivaraman , Andrzej J. Strojwas Diagnosis of parametric path delay faults. [Citation Graph (0, 0)][DBLP ] VLSI Design, 1996, pp:412-417 [Conf ] Mukund Sivaraman , Andrzej J. Strojwas Primitive Path Delay Fault Identification. [Citation Graph (0, 0)][DBLP ] VLSI Design, 1997, pp:95-100 [Conf ] Mukund Sivaraman , Andrzej J. Strojwas A diagnosability metric for parametric path delay faults. [Citation Graph (0, 0)][DBLP ] VTS, 1996, pp:316-323 [Conf ] Juan Antonio Carballo , Yervant Zorian , Raul Camposano , Andrzej J. Strojwas , John Kibarian , Dennis Wassung , Alex Alexanian , Steve Wigley , Neil Kelly Guest Editors' Introduction: DFM Drives Changes in Design Flow. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2005, v:22, n:3, pp:200-205 [Journal ] Jacques Benkoski , Andrzej J. Strojwas A New Approach to Hierarchical and Statistical Timing Simulations. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1987, v:6, n:6, pp:1039-1052 [Journal ] Ihao Chen , Andrzej J. Strojwas A Methodology for Optimal Test Structure Design for Statistical Process Characterization and Diagnosis. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1987, v:6, n:4, pp:592-600 [Journal ] Ihao Chen , Andrzej J. Strojwas Realistic Yield Simulation for VLSIC Structural Failures. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1987, v:6, n:6, pp:965-980 [Journal ] Robert W. Dutton , Andrzej J. Strojwas Perspectives on technology and technology-driven CAD. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2000, v:19, n:12, pp:1544-1560 [Journal ] Shigetaka Kumashiro , Ronald A. Rohrer , Andrzej J. Strojwas Asymptotic waveform evaluation for transient analysis of 3-D interconnect structures. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:7, pp:988-996 [Journal ] Wojciech Maly , Andrzej J. Strojwas Statistical Simulation of the IC Manufacturing Process. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1982, v:1, n:3, pp:120-131 [Journal ] Wojciech Maly , Andrzej J. Strojwas , Stephen W. Director VLSI Yield Prediction and Estimation: A Unified Framework. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1986, v:5, n:1, pp:114-130 [Journal ] Sani R. Nassif , Andrzej J. Strojwas , Stephen W. Director FABRICS II: A Statistically Based IC Fabrication Process Simulator. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1984, v:3, n:1, pp:40-46 [Journal ] Sani R. Nassif , Andrzej J. Strojwas , Stephen W. Director A Methodology for Worst-Case Analysis of Integrated Circuits. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1986, v:5, n:1, pp:104-113 [Journal ] Mariusz Niewczas , Wojciech Maly , Andrzej J. Strojwas An algorithm for determining repetitive patterns in very large IC layouts. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:4, pp:494-501 [Journal ] Davide Pandini , Lawrence T. Pileggi , Andrzej J. Strojwas Global and local congestion optimization in technology mapping. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2003, v:22, n:4, pp:498-505 [Journal ] Rahul Razdan , Andrzej J. Strojwas A Statistical Design Rule Developer. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1986, v:5, n:4, pp:508-520 [Journal ] Mukund Sivaraman , Andrzej J. Strojwas Primitive path delay faults: identification and their use in timinganalysis. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2000, v:19, n:11, pp:1347-1362 [Journal ] Mukund Sivaraman , Andrzej J. Strojwas Path delay fault diagnosis and coverage-a metric and an estimationtechnique. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2001, v:20, n:3, pp:440-457 [Journal ] Andrzej J. Strojwas , Stephen W. Director A Pattern Recognition Based Method for IC Failure Analysis. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:1, pp:76-92 [Journal ] Andrzej J. Strojwas , Stephen W. Director An efficient algorithm for parametric fault simulation of monolithic IC's. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1991, v:10, n:8, pp:1049-1058 [Journal ] Xiaowei Tian , Andrzej J. Strojwas Numerical integral method for diffusion modeling. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1991, v:10, n:9, pp:1110-1124 [Journal ] D. M. H. Walker , Chris S. Kellen , David M. Svoboda , Andrzej J. Strojwas The CDB/HCDB semiconductor wafer representation server. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:2, pp:283-295 [Journal ] Marco Casale-Rossi , Andrzej J. Strojwas , Robert C. Aitken , Antun Domic , Carlo Guardiani , Philippe Magarshack , Douglas Pattullo , Joseph Sawicki DFM/DFY: should you trust the surgeon or the family doctor? [Citation Graph (0, 0)][DBLP ] DATE, 2007, pp:439-442 [Conf ] Creating an affordable 22nm node using design-lithography co-optimization. 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