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Publications of Author

1. C.-J. Richard Shi, Michael W. Tian
   Automatic Test Generation for Linear Analog Circuits under Parameter Variations. [Citation Graph (0, 0)][DBLP]
   ASP-DAC, 1998, pp:501-506 [Conf]
   
2. Michael W. Tian, C.-J. Richard Shi
   Rapid Frequency-Domain Analog Fault Simulation Under Parameter Tolerances. [Citation Graph (0, 0)][DBLP]
   DAC, 1997, pp:275-280 [Conf]
   
3. Michael W. Tian, C.-J. Richard Shi
   Efficient DC Fault Simulation of Nonlinear Analog Circuits. [Citation Graph (0, 0)][DBLP]
   DATE, 1998, pp:899-904 [Conf]
   
4. Michael W. Tian, C.-J. Richard Shi
   Nonlinear Analog DC Fault Simulation by One-Step Relaxation. [Citation Graph (0, 0)][DBLP]
   VTS, 1998, pp:126-131 [Conf]
   
5. C.-J. Richard Shi, Michael W. Tian, Guoyong Shi
   Efficient DC fault simulation of nonlinear analog circuits: one-step relaxation and adaptive simulation continuation. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:7, pp:1392-1400 [Journal]
   
6. C.-J. Richard Shi, Michael W. Tian
   Simulation and sensitivity of linear analog circuits under parameter variations by Robust interval analysis. [Citation Graph (0, 0)][DBLP]
   ACM Trans. Design Autom. Electr. Syst., 1999, v:4, n:3, pp:280-312 [Journal]