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Michihiro Shintani: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Michihiro Shintani, Toshihiro Ohara, Hideyuki Ichihara, Tomoo Inoue
A Huffman-based coding with efficient test application. [Citation Graph (0, 0)][DBLP]
ASP-DAC, 2005, pp:75-78 [Conf] - Hideyuki Ichihara, Masakuni Ochi, Michihiro Shintani, Tomoo Inoue
A Test Decompression Scheme for Variable-Length Coding. [Citation Graph (0, 0)][DBLP]
Asian Test Symposium, 2004, pp:426-431 [Conf] - Hideyuki Ichihara, Michihiro Shintani, Toshihiro Ohara, Tomoo Inoue
Test Response Compression Based on Huffman Coding. [Citation Graph (0, 0)][DBLP]
Asian Test Symposium, 2003, pp:446-451 [Conf] - Hideyuki Ichihara, Michihiro Shintani, Tomoo Inoue
Huffman-Based Test Response Coding. [Citation Graph (0, 0)][DBLP]
IEICE Transactions, 2005, v:88, n:1, pp:158-161 [Journal]
An Adaptive Test for Parametric Faults Based on Statistical Timing Information. [Citation Graph (, )][DBLP]
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