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Ramashis Das: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Ramashis Das, Igor L. Markov, John P. Hayes
    On-Chip Test Generation Using Linear Subspaces. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2006, pp:111-116 [Conf]

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