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E. Gouno: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. D. Han, N. Balakrishnan, A. Sen, E. Gouno
    Corrections on "Optimal Step-Stress Test Under Progressive Type-I Censoring". [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:4, pp:613-614 [Journal]
  2. E. Gouno, A. Sen, N. Balakrishnan
    Optimal step-stress test under progressive type-I censoring. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:388-393 [Journal]

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