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Ward De Ceuninck: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. R. Dreesen, K. Croes, J. Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken
    A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:3, pp:437-443 [Journal]
  2. K. Croes, R. Dreesen, J. Manca, Ward De Ceuninck, Luc De Schepper, L. Tielemans, P. van Der Wel
    High-resolution in-situ of gold electromigration: test time reduction. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1439-1442 [Journal]
  3. R. Petersen, Ward De Ceuninck, Jan D'Haen, Marc D'Olieslaeger, Luc De Schepper, O. Vendier, H. Blanck, D. Pons
    Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1359-1363 [Journal]
  4. E. Andries, R. Dreesen, K. Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen
    Statistical aspects of the degradation of LDD nMOSFETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1409-1413 [Journal]
  5. S. Aresu, Ward De Ceuninck, R. Dreesen, K. Croes, E. Andries, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger
    High-resolution SILC measurements of thin SiO2 at ultra low voltages. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1485-1489 [Journal]
  6. L. Tielemans, R. Rongen, Ward De Ceuninck
    How reliable are reliability tests? [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1339-1345 [Journal]
  7. S. Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen
    A new method for the analysis of high-resolution SILC data. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1483-1488 [Journal]
  8. P. Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, E. Beyne
    Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1785-1790 [Journal]

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