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Gordon Russell: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. D. J. Kinniment, Oleh V. Maevsky, Gordon Russell, Alexandre Yakovlev, Alexandre V. Bystrov
    On-Chip Structures for Timing Measurements and Test. [Citation Graph (0, 0)][DBLP]
    ASYNC, 2002, pp:190-0 [Conf]
  2. David Kinniment, Keith Heron, Gordon Russell
    Measuring Deep Metastability. [Citation Graph (0, 0)][DBLP]
    ASYNC, 2006, pp:2-11 [Conf]
  3. Nikolaos Minas, David Kinniment, Keith Heron, Gordon Russell
    A High Resolution Flash Time-to-Digital Converter Taking Into Account Process Variability. [Citation Graph (0, 0)][DBLP]
    ASYNC, 2007, pp:163-174 [Conf]
  4. M. A. Abas, Gordon Russell, D. J. Kinniment
    Design of Sub-10-Picoseconds On-Chip Time Measurement Circuit. [Citation Graph (0, 0)][DBLP]
    DATE, 2004, pp:804-809 [Conf]
  5. Trevor Paterson, Jessie B. Kennedy, Martin R. Pullan, Alan Cannon, Kate Armstrong, Mark F. Watson, Cedric Raguenaud, Sarah M. McDonald, Gordon Russell
    A Universal Character Model and Ontology of Defined Terms for Taxonomic Description. [Citation Graph (0, 0)][DBLP]
    DILS, 2004, pp:63-78 [Conf]
  6. Gordon Russell, Andrew Cumming
    Improving the Student Learning Experience for SQL Using Automatic Marking. [Citation Graph (0, 0)][DBLP]
    CELDA, 2004, pp:281-288 [Conf]
  7. Jun Zhou, David Kinniment, Gordon Russell, Alex Yakovlev
    A Robust Synchronizer. [Citation Graph (0, 0)][DBLP]
    ISVLSI, 2006, pp:442-443 [Conf]
  8. D. J. Kinniment, Oleh V. Maevsky, Alexandre V. Bystrov, Gordon Russell, Alexandre Yakovlev
    On-chip structures for timing measurement and test. [Citation Graph (0, 0)][DBLP]
    Microprocessors and Microsystems, 2003, v:27, n:9, pp:473-483 [Journal]
  9. David Kinniment, Charles E. Dike, Keith Heron, Gordon Russell, Alexandre Yakovlev
    Measuring Deep Metastability and Its Effect on Synchronizer Performance. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2007, v:15, n:9, pp:1028-1039 [Journal]

  10. The impact of variability on the reliability of long on-chip interconnect in the presence of crosstalk. [Citation Graph (, )][DBLP]

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