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John Bainbridge :
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Andrew M. Scott , Mark E. Schuelein , Marly Roncken , Jin-Jer Hwan , John Bainbridge , John R. Mawer , David L. Jackson , Andrew Bardsley Asynchronous on-Chip Communication: Explorations on the Intel PXA27x Processor Peripheral Bus. [Citation Graph (0, 0)][DBLP ] ASYNC, 2007, pp:60-72 [Conf ] Aristides Efthymiou , John Bainbridge , Douglas A. Edwards Adding Testability to an Asynchronous Interconnect for GALS SoC. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 2004, pp:20-23 [Conf ] John Bainbridge , R. W. Whitty , John Wordsworth Obtaining Structural Metrics of Z Specifications for Systems Development. [Citation Graph (0, 0)][DBLP ] Z User Workshop, 1990, pp:269-281 [Conf ] John Bainbridge A Heuristic Method for Generating Large Random Expressions. [Citation Graph (0, 0)][DBLP ] Inf. Process. Lett., 1992, v:44, n:3, pp:165-170 [Journal ] John Bainbridge , Stephen B. Furber Chain: A Delay-Insensitive Chip Area Interconnect. [Citation Graph (0, 0)][DBLP ] IEEE Micro, 2002, v:22, n:5, pp:16-23 [Journal ] Stephen B. Furber , John Bainbridge , J. Mike Cumpstey , Steve Temple Sparse distributed memory using N -of-M codes. [Citation Graph (0, 0)][DBLP ] Neural Networks, 2004, v:17, n:10, pp:1437-1451 [Journal ] John Bainbridge Defining Testability Metrics Axiomatically. [Citation Graph (0, 0)][DBLP ] Softw. Test., Verif. Reliab., 1994, v:4, n:2, pp:63-80 [Journal ] Aristides Efthymiou , John Bainbridge , Douglas A. Edwards Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect. [Citation Graph (0, 0)][DBLP ] IEEE Trans. VLSI Syst., 2005, v:13, n:12, pp:1384-1393 [Journal ] An On-Chip and Inter-Chip Communications Network for the SpiNNaker Massively-Parallel Neural Net Simulator. [Citation Graph (, )][DBLP ] Search in 0.001secs, Finished in 0.002secs