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Serge N. Demidenko: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Serge N. Demidenko, Kenneth V. Lever
    Accelerating Test Data Processin. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1999, pp:113-0 [Conf]
  2. Serge N. Demidenko, Vincenzo Piuri
    On-Line Testing In Digital Neural Networks. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1996, pp:295-0 [Conf]
  3. Serge N. Demidenko, A. J. van de Goor, S. Henderson, P. Knoppers
    Simulation and Development of Short Transparent Tests for RAM. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:164-0 [Conf]
  4. Serge N. Demidenko, Alexander Ivanyukovich, Leonid Makhist, Vincenzo Piuri
    Error masking in compact testing based on the Hamming code and its modifications. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1995, pp:303-0 [Conf]
  5. Vyacheslav N. Yarmolik, Yuri V. Klimets, Serge N. Demidenko
    March PS(23N) Test for DRAM Pattern-Sensitive Faults. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1998, pp:354-0 [Conf]
  6. Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko
    Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2005, pp:472- [Conf]
  7. Serge N. Demidenko, Victor Lai
    Industry-Academia Collaboration in Undergraduate Test Engineering Unit Development. [Citation Graph (0, 0)][DBLP]
    DELTA, 2006, pp:116-122 [Conf]
  8. Serge N. Demidenko, Rauf Kh. Sadykhov, Alexey N. Klimovich, Leonid P. Podenok, Maxim E. Vatkin
    Neural Networks to Solve the Problems of Control and Identification. [Citation Graph (0, 0)][DBLP]
    DELTA, 2002, pp:318-320 [Conf]
  9. Warwick Allen, Donald Bailey, Serge N. Demidenko, Vincenzo Piuri
    Test Chirp Signal Generation Using Spectral Warping. [Citation Graph (0, 0)][DBLP]
    DELTA, 2002, pp:492-495 [Conf]
  10. Donald Bailey, Warwick Allen, Serge N. Demidenko
    Spectral Warping Revisited. [Citation Graph (0, 0)][DBLP]
    DELTA, 2004, pp:23-28 [Conf]
  11. Serge N. Demidenko, Wayne Moorhead
    Electronic Test Technology Curriculum Revisiting. [Citation Graph (0, 0)][DBLP]
    DELTA, 2006, pp:129-136 [Conf]
  12. R. Browne, Serge N. Demidenko, R. O'Driscoll
    Harnessing Geographically Distributed Cooperation in Microtechnology Course at Massey University. [Citation Graph (0, 0)][DBLP]
    DELTA, 2002, pp:250-256 [Conf]
  13. Wayne Moorhead, Serge N. Demidenko
    Making ATE Accessible for Academic Institutions. [Citation Graph (0, 0)][DBLP]
    DELTA, 2002, pp:219-222 [Conf]
  14. Serge N. Demidenko, Eugene M. Levine, Vincenzo Piuri
    Synthesis of On-Line Testing Control Units: Flow Graph Coding/Monitoring Approach. [Citation Graph (0, 0)][DBLP]
    DFT, 2000, pp:266-274 [Conf]
  15. Serge N. Demidenko, Vincenzo Piuri, Vyacheslav N. Yarmolik, A. Shmidman
    BIST Module for Mixed-Signal Circuits. [Citation Graph (0, 0)][DBLP]
    DFT, 1998, pp:349-0 [Conf]
  16. Gourab Sen Gupta, R. Paddison, Chris H. Messom, S. Demidenko
    Wireless Master-Slave Embedded Controller for a Teleoperated Anthropomorphic Robotic Arm with Gripping Force Sensing. [Citation Graph (0, 0)][DBLP]
    ICN/ICONS/MCL, 2006, pp:164- [Conf]
  17. Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko
    Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:2, pp:88-98 [Journal]
  18. Serge N. Demidenko, Vincenzo Piuri
    Concurrent diagnosis in digital implementations of neural networks. [Citation Graph (0, 0)][DBLP]
    Neurocomputing, 2002, v:48, n:1-4, pp:879-903 [Journal]
  19. W. P. M. Allen, D. G. Bailey, Serge N. Demidenko, Vincenzo Piuri
    Analysis and application of digital spectral warping in analog and mixed-signal testing. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:4, pp:444-457 [Journal]

  20. Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices. [Citation Graph (, )][DBLP]


  21. Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers. [Citation Graph (, )][DBLP]


  22. Fast and Accurate Automatic Defect CLuster Extraction for Semiconductor Wafers. [Citation Graph (, )][DBLP]


  23. Virtual Instrumentation Based IC Parametric Tester for Engineering Education. [Citation Graph (, )][DBLP]


  24. Project-Based Learning in Robotics and Electronics in Undergraduate Engineering Program Setting. [Citation Graph (, )][DBLP]


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