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Carol Pyron: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Magdy S. Abadir, Jing Zeng, Carol Pyron, Juhong Zhu
    Automated Test Model Generation from Switch Level Custom Circuits. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2003, pp:184-189 [Conf]
  2. John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns
    valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1040-1049 [Conf]
  3. Carol Pyron
    Scan and BIST Can Almost Achieve Test Quality Levels. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1196- [Conf]
  4. Carol Pyron
    Representing Boundary Scan Tests with the EDIF Test View. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:1105- [Conf]
  5. Carol Pyron, Mike Alexander, James Golab, George Joos, Bruce Long, Robert F. Molyneaux, Rajesh Raina, Nandu Tendolkar
    DFT advances in the Motorola's MPC7400, a PowerPC G4 microprocessor. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:137-146 [Conf]
  6. Carol Pyron, W. C. Bruce
    Implementing 1149.1 in the PowerPCTM RISC Microprocessor Family. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:844-850 [Conf]
  7. Carol Pyron, Rekha Bangalore, Dawit Belete, Jason Goertz, Ashutosh Razdan, Denise Younger
    Silicon Symptoms to Solutions: Applying Design for Debug Techniques. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:664-672 [Conf]
  8. Carol Pyron, Javier Prado, James Golab
    Next-Generation PowerPCTM Microprocessor Test Strategy Improvements. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:414-423 [Conf]
  9. Carol Pyron, Rex Sallade
    CAE Functionality for Verification of Diagnostic Programs. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:94-102 [Conf]
  10. Michael G. Wahl, Carol Pyron
    EDIF Test - The Upcoming Standard for Test Data Transfers. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:453-458 [Conf]
  11. Nandu Tendolkar, Robert F. Molyneaux, Carol Pyron, Rajesh Raina
    At-Speed Testing of Delay Faults for Motorola's MPC7400, a PowerPC(tm) Microprocessor. [Citation Graph (0, 0)][DBLP]
    VTS, 2000, pp:3-8 [Conf]
  12. Carol Pyron, Javier Prado, James Golab
    Test Strategy for the PowerPC 750 Microprocessor. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:90-97 [Journal]

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