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Soumendu Bhattacharya: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Soumendu Bhattacharya, Abhijit Chatterjee
    A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:68-73 [Conf]
  2. Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee
    Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. [Citation Graph (0, 0)][DBLP]
    DATE, 2004, pp:280-285 [Conf]
  3. Soumendu Bhattacharya, Abhijit Chatterjee
    Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models. [Citation Graph (0, 0)][DBLP]
    DELTA, 2002, pp:25-32 [Conf]
  4. Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee
    Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. [Citation Graph (0, 0)][DBLP]
    DELTA, 2004, pp:372-377 [Conf]
  5. Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt
    On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). [Citation Graph (0, 0)][DBLP]
    IOLTS, 2005, pp:106-111 [Conf]
  6. Soumendu Bhattacharya, Abhijit Chatterjee
    Use of Embedded Sensors for Built-In-Test of RF Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:801-809 [Conf]
  7. Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee
    Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:665-673 [Conf]
  8. Soumendu Bhattacharya, Vishwanath Natarajan, Abhijit Chatterjee, Sankar Nair
    Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2006, pp:729-733 [Conf]
  9. Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee
    A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2005, pp:289-294 [Conf]
  10. Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterj
    Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:208-213 [Conf]
  11. Soumendu Bhattacharya, Abhijit Chatterjee
    High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:89-100 [Conf]
  12. Soumendu Bhattacharya, Abhijit Chatterjee
    Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices. [Citation Graph (0, 0)][DBLP]
    VTS, 2005, pp:137-142 [Conf]
  13. Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee
    System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:229-236 [Conf]
  14. Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee
    Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:192-199 [Conf]
  15. Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
    Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:125-130 [Conf]
  16. Abhijit Chatterjee, P. P. Das, Soumendu Bhattacharya
    Visualization in linear programming using parallel coordinates. [Citation Graph (0, 0)][DBLP]
    Pattern Recognition, 1993, v:26, n:11, pp:1725-1736 [Journal]
  17. Soumendu Bhattacharya, Abhijit Chatterjee
    Optimized wafer-probe and assembled package test design for analog circuits. [Citation Graph (0, 0)][DBLP]
    ACM Trans. Design Autom. Electr. Syst., 2005, v:10, n:2, pp:303-329 [Journal]
  18. Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
    Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2006, pp:35-42 [Conf]
  19. Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee
    Low Cost Parametric Failure Diagnosis of RF Transceivers. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2006, pp:205-212 [Conf]
  20. Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee
    Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:3, pp:323-339 [Journal]

  21. Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. [Citation Graph (, )][DBLP]

  22. A DFT Approach for Testing Embedded Systems Using DC Sensors. [Citation Graph (, )][DBLP]

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