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Soumendu Bhattacharya:
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- Soumendu Bhattacharya, Abhijit Chatterjee
A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2004, pp:68-73 [Conf]
- Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee
Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. [Citation Graph (0, 0)][DBLP] DATE, 2004, pp:280-285 [Conf]
- Soumendu Bhattacharya, Abhijit Chatterjee
Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models. [Citation Graph (0, 0)][DBLP] DELTA, 2002, pp:25-32 [Conf]
- Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee
Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. [Citation Graph (0, 0)][DBLP] DELTA, 2004, pp:372-377 [Conf]
- Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt
On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). [Citation Graph (0, 0)][DBLP] IOLTS, 2005, pp:106-111 [Conf]
- Soumendu Bhattacharya, Abhijit Chatterjee
Use of Embedded Sensors for Built-In-Test of RF Circuits. [Citation Graph (0, 0)][DBLP] ITC, 2004, pp:801-809 [Conf]
- Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee
Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. [Citation Graph (0, 0)][DBLP] ITC, 2003, pp:665-673 [Conf]
- Soumendu Bhattacharya, Vishwanath Natarajan, Abhijit Chatterjee, Sankar Nair
Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms. [Citation Graph (0, 0)][DBLP] VLSI Design, 2006, pp:729-733 [Conf]
- Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. [Citation Graph (0, 0)][DBLP] VLSI Design, 2005, pp:289-294 [Conf]
- Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterj
Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction. [Citation Graph (0, 0)][DBLP] VTS, 2006, pp:208-213 [Conf]
- Soumendu Bhattacharya, Abhijit Chatterjee
High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost. [Citation Graph (0, 0)][DBLP] VTS, 2003, pp:89-100 [Conf]
- Soumendu Bhattacharya, Abhijit Chatterjee
Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices. [Citation Graph (0, 0)][DBLP] VTS, 2005, pp:137-142 [Conf]
- Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. [Citation Graph (0, 0)][DBLP] VTS, 2004, pp:229-236 [Conf]
- Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee
Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors. [Citation Graph (0, 0)][DBLP] VTS, 2006, pp:192-199 [Conf]
- Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors. [Citation Graph (0, 0)][DBLP] VTS, 2007, pp:125-130 [Conf]
- Abhijit Chatterjee, P. P. Das, Soumendu Bhattacharya
Visualization in linear programming using parallel coordinates. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1993, v:26, n:11, pp:1725-1736 [Journal]
- Soumendu Bhattacharya, Abhijit Chatterjee
Optimized wafer-probe and assembled package test design for analog circuits. [Citation Graph (0, 0)][DBLP] ACM Trans. Design Autom. Electr. Syst., 2005, v:10, n:2, pp:303-329 [Journal]
- Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study. [Citation Graph (0, 0)][DBLP] European Test Symposium, 2006, pp:35-42 [Conf]
- Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee
Low Cost Parametric Failure Diagnosis of RF Transceivers. [Citation Graph (0, 0)][DBLP] European Test Symposium, 2006, pp:205-212 [Conf]
- Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee
Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications. [Citation Graph (0, 0)][DBLP] J. Electronic Testing, 2005, v:21, n:3, pp:323-339 [Journal]
Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. [Citation Graph (, )][DBLP]
A DFT Approach for Testing Embedded Systems Using DC Sensors. [Citation Graph (, )][DBLP]
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