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Publications of Author

1. S. Biswas, P. Srikanth, R. Jha, S. Mukhopadhyay, A. Patra, D. Sarkar
   On-Line Testing of Digital Circuits for n-Detect and Bridging Fault Models. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2005, pp:88-93 [Conf]
   
2. Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra
   A BIST Approach to On-Line Monitoring of Digital VLSI Circuits: A CAD Tool. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2004, pp:184-189 [Conf]
   
3. S. Biswas, S. Mukhopadhyay, P. Patra, D. Sarkar
   Concurrent Testing of Digital Circuits for Advanced Fault Models. [Citation Graph (0, 0)][DBLP]
   DDECS, 2006, pp:204-209 [Conf]
   
4. Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra
   Optimization of the Theory of FDD of DES for Alleviation of the State Explosion Problem and Development of CAD Tools for On-line Testing of Digital VLSI Circuits. [Citation Graph (0, 0)][DBLP]
   IOLTS, 2004, pp:184-0 [Conf]
   
5. Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra
   A discrete event systems approach to online testing of digital VLSI circuits. [Citation Graph (0, 0)][DBLP]
   SMC (2), 2004, pp:1699-1704 [Conf]
   
6. Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra
   A Formal Approach to On-Line Monitoring of Digital VLSI Circuits: Theory, Design and Implementation. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2005, v:21, n:5, pp:503-537 [Journal]
   
7. 
   Layered Higher Order N-grams for Hardening Payload Based Anomaly Intrusion Detection. [Citation Graph (, )][DBLP]
   
   
8. 
   FPGA based chip emulation system for test development and verification of analog and mixed signal circuits (abstract only). [Citation Graph (, )][DBLP]
   
   
9. 
   Distance Based Fast Hierarchical Clustering Method for Large Datasets. [Citation Graph (, )][DBLP]
   
   
10. 
    An Active Intrusion Detection System for LAN Specific Attacks. [Citation Graph (, )][DBLP]