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Antonio Rubio: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Josep Altet, Antonio Rubio, Hideo Tamamoto
    Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1997, pp:149-154 [Conf]
  2. Víctor H. Champac, Antonio Rubio, Joan Figueras
    Analysis of the Floating Gate Defect in CMOS. [Citation Graph (0, 0)][DBLP]
    DFT, 1993, pp:101-108 [Conf]
  3. C. Ferrer, D. Dateo, J. Oliver, Antonio Rubio, M. Rullán
    An Approach to the Development of a IDDQ Testable Cell Library. [Citation Graph (0, 0)][DBLP]
    DFT, 1994, pp:46-54 [Conf]
  4. Johan Lambie, Francesc Moll Echeto, José Luis González, Antonio Rubio
    Asynchronous pulse logic cell for threshold logic and Boolean networks. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2005, pp:460-463 [Conf]
  5. Douglas Reed, Jason Doege, Antonio Rubio
    Improving Board and System Test: A Proposal to Integrate Boundary Scan and IDDQ. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:577-585 [Conf]
  6. Josep Altet, Antonio Rubio
    Differential Sensing Strategy for Dynamic Thermal Testing of ICs. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:434-439 [Conf]
  7. Josep Altet, Antonio Rubio, E. Schaub, Stefan Dilhaire, Wilfrid Claeys
    Thermal Testing: Fault Location Strategies. [Citation Graph (0, 0)][DBLP]
    VTS, 2000, pp:189-194 [Conf]
  8. Josep Altet, Antonio Rubio, M. Amine Salhi, J. L. Gálvez, Stefan Dilhaire, Ashish Syal, André Ivanov
    Sensing temperature in CMOS circuits for Thermal Testing. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:179-184 [Conf]
  9. Xavier Aragonès, José Luis González, Francesc Moll, Antonio Rubio
    Noise Generation and Coupling Mechanisms in Deep-Submicron ICs. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:5, pp:27-35 [Journal]
  10. Víctor H. Champac, Antonio Rubio, Joan Figueras
    Electrical model of the floating gate defect in CMOS ICs: implications on IDDQ testing. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1994, v:13, n:3, pp:359-369 [Journal]
  11. Miquel Roca, Antonio Rubio
    Current testability analysis of feedback bridging faults in CMOS circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1995, v:14, n:10, pp:1299-1305 [Journal]
  12. Antonio Rubio, Noriyoshi Itazaki, Xiaole Xu, Kozo Kinoshita
    An approach to the analysis and detection of crosstalk faults in digital VLSI circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1994, v:13, n:3, pp:387-395 [Journal]
  13. Javier Ramírez, José C. Segura, Carmen Benítez, Ángel de la Torre, Antonio Rubio
    Efficient voice activity detection algorithms using long-term speech information. [Citation Graph (0, 0)][DBLP]
    Speech Communication, 2004, v:42, n:3-4, pp:271-287 [Journal]
  14. Josep Altet, J. M. Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby
    Applications of temperature phase measurements to IC testing. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:1, pp:95-103 [Journal]
  15. Miguel A. Méndez, José Luis González, Diego Mateo, Antonio Rubio
    An investigation on the relation between digital circuitry characteristics and power supply noise spectrum in mixed-signal CMOS integrated circuits. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:1, pp:77-84 [Journal]
  16. Rajesh Galivanche, Rohit Kapur, Antonio Rubio
    Testing in the year 2020. [Citation Graph (0, 0)][DBLP]
    DATE, 2007, pp:960-965 [Conf]
  17. Arindam Calomarde, Diego Mateo, Antonio Rubio
    High level spectral-based analysis of power consumption in DSPs systems. [Citation Graph (0, 0)][DBLP]
    ISCAS, 2006, pp:- [Conf]
  18. Arindam Calomarde, Antonio Rubio, Jordi Saludes
    Selective Clock-Gating for Low-Power Synchronous Counters. [Citation Graph (0, 0)][DBLP]
    J. Low Power Electronics, 2005, v:1, n:3, pp:217-225 [Journal]

  19. Circuit propagation delay estimation through multivariate regression-based modeling under spatio-temporal variability. [Citation Graph (, )][DBLP]


  20. MODEST: a model for energy estimation under spatio-temporal variability. [Citation Graph (, )][DBLP]


  21. Data Dependence of Delay Distribution for a Planar Bus. [Citation Graph (, )][DBLP]


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