Search the dblp DataBase

Publications of Author

1. Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Nagesh Tamarapalli, Janusz Rajski
   Compactor Independent Direct Diagnosis. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2004, pp:204-209 [Conf]
   
2. Kun-Han Tsai, Sybille Hellebrand, Janusz Rajski, Malgorzata Marek-Sadowska
   STARBIST: Scan Autocorrelated Random Pattern Generation. [Citation Graph (0, 0)][DBLP]
   DAC, 1997, pp:472-477 [Conf]
   
3. Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski
   Multiple Fault Diagnosis Using n-Detection Tests. [Citation Graph (0, 0)][DBLP]
   ICCD, 2003, pp:198-0 [Conf]
   
4. Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski
   Diagnosis of Hold Time Defects. [Citation Graph (0, 0)][DBLP]
   ICCD, 2004, pp:192-199 [Conf]
   
5. Vishal J. Mehta, Malgorzata Marek-Sadowska, Zhiyuan Wang, Kun-Han Tsai, Janusz Rajski
   Delay Fault Diagnosis for Non-Robust Test. [Citation Graph (0, 0)][DBLP]
   ISQED, 2006, pp:463-472 [Conf]
   
6. Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski
   Delay Fault Diagnosis Using Timing Information. [Citation Graph (0, 0)][DBLP]
   ISQED, 2004, pp:485-490 [Conf]
   
7. Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski
   Impact of Multiple-Detect Test Patterns on Product Quality. [Citation Graph (0, 0)][DBLP]
   ITC, 2003, pp:1031-1040 [Conf]
   
8. Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski
   Realizing High Test Quality Goals with Smart Test Resource Usage. [Citation Graph (0, 0)][DBLP]
   ITC, 2004, pp:525-533 [Conf]
   
9. Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian
   Embedded Deterministic Test for Low-Cost Manufacturing Test. [Citation Graph (0, 0)][DBLP]
   ITC, 2002, pp:301-310 [Conf]
   
10. Kun-Han Tsai, Malgorzata Marek-Sadowska, Janusz Rajski
    Scan-Encoded Test Pattern Generation for BIST. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:548-556 [Conf]
    
11. Zhiyuan Wang, Kun-Han Tsai, Malgorzata Marek-Sadowska, Janusz Rajski
    An Efficient and Effective Methodology on the Multiple Fault Diagnosis. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:329-338 [Conf]
    
12. Vlado Vorisek, Bruce Swanson, Kun-Han Tsai, Dhiraj Goswami
    Improved Handling of False and Multicycle Paths in ATPG. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:160-165 [Conf]
    
13. Kun-Han Tsai, Janusz Rajski, Malgorzata Marek-Sadowska
    Star test: the theory and its applications. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2000, v:19, n:9, pp:1052-1064 [Journal]
    
14. Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski
    Delay-fault diagnosis using timing information. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:9, pp:1315-1325 [Journal]
    
15. Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski
    Analysis and methodology for multiple-fault diagnosis. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:3, pp:558-575 [Journal]
    
16. Dhiraj Goswami, Kun-Han Tsai, Mark Kassab, Janusz Rajski
    Test Generation in the Presence of Timing Exceptions and Constraints. [Citation Graph (0, 0)][DBLP]
    DAC, 2007, pp:688-693 [Conf]
    
17. 
    At-Speed Scan Test Method for the Timing Optimization and Calibration. [Citation Graph (, )][DBLP]
    
    
18. 
    Timing-Aware Multiple-Delay-Fault Diagnosis. [Citation Graph (, )][DBLP]
    
    
19. 
    Scan based speed-path debug for a microprocessor. [Citation Graph (, )][DBLP]
    
    
20. 
    Speed-Path Debug Using At-Speed Scan Test Patterns. [Citation Graph (, )][DBLP]