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Sasikumar Cherubal: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Sasikumar Cherubal
    Challenges in Next Generation Mixed-Signal IC Production Testing. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2005, pp:466- [Conf]
  2. Sasikumar Cherubal, Abhijit Chatterjee
    Test generation for fault isolation in analog circuits using behavioral models. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2000, pp:19-24 [Conf]
  3. Sasikumar Cherubal, Abhijit Chatterjee
    Test generation based diagnosis of device parameters for analog circuits. [Citation Graph (0, 0)][DBLP]
    DATE, 2001, pp:596-602 [Conf]
  4. Sasikumar Cherubal, Abhijit Chatterjee
    Parametric Fault Diagnosis for Analog Systems Using Functional Mapping. [Citation Graph (0, 0)][DBLP]
    DATE, 1999, pp:195-0 [Conf]
  5. Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee
    Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. [Citation Graph (0, 0)][DBLP]
    DATE, 2004, pp:280-285 [Conf]
  6. Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee
    A Signature Test Framework for Rapid Production Testing of RF Circuits. [Citation Graph (0, 0)][DBLP]
    DATE, 2002, pp:186-191 [Conf]
  7. Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee
    Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. [Citation Graph (0, 0)][DBLP]
    DELTA, 2004, pp:372-377 [Conf]
  8. Sasikumar Cherubal, Abhijit Chatterjee
    A Methodology for Efficient Simulation and Diagnosis of Mixed-Signal Systems Using Error Waveforms. [Citation Graph (0, 0)][DBLP]
    DFT, 1999, pp:357-0 [Conf]
  9. Sasikumar Cherubal, Abhijit Chatterjee
    Optimal INL/DNL testing of A/D converters using a linear model. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:358-366 [Conf]
  10. Sasikumar Cherubal, Abhijit Chatterjee
    A high-resolution jitter measurement technique using ADC sampling. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:838-847 [Conf]
  11. Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao
    Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:903-912 [Conf]
  12. Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee
    Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:1174-1181 [Conf]
  13. Sasikumar Cherubal, Abhijit Chatterjee
    An Efficient Hierarchical Fault Isolation Technique for Mixed-Signal Boards. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2000, pp:550-555 [Conf]
  14. Sasikumar Cherubal, Ramakrishna Voorakaranam, Abhijit Chatterjee, John McLaughlin, Jason L. Smith, David M. Majernik
    Concurrent RF Test Using Optimized Modulated RF Stimuli. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2004, pp:1017-1022 [Conf]
  15. Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee
    System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:229-236 [Conf]
  16. Pramodchandran N. Variyam, Sasikumar Cherubal, Abhijit Chatterjee
    Prediction of analog performance parameters using fast transienttesting. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:3, pp:349-361 [Journal]

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