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Publications of Author

1. Yann Antonioli, Tsuneo Inufushi, Shigeki Nishikawa, Kozo Kinoshita
   A high-speed IDDQ sensor implementation. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2000, pp:356-361 [Conf]
   
2. Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita
   Reducing Scan Shifts Using Folding Scan Trees. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2003, pp:6-11 [Conf]
   
3. Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita
   On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure. [Citation Graph (0, 0)][DBLP]
   DELTA, 2004, pp:269-274 [Conf]
   
4. Hideyuki Ichihara, Kozo Kinoshita, Koji Isodono, Shigeki Nishikawa
   Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2003, pp:329-334 [Conf]
   
5. Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita
   Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2005, v:21, n:6, pp:613-620 [Journal]