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Kenichi Ichino:
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Publications of Author
- Masayuki Arai, Harunobu Kurokawa, Kenichi Ichino, Satoshi Fukumoto, Kazuhiko Iwasaki
Seed Selection Procedure for LFSR-Based BIST with Multiple Scan Chains and Phase Shifters. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2004, pp:190-195 [Conf]
- Kenichi Ichino, Takeshi Asakawa, Satoshi Fukumoto, Kazuhiko Iwasaki, Seiji Kajihara
Hybrid BIST Using Partially Rotational Scan. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2001, pp:379-384 [Conf]
- Yuki Yamagata, Kenichi Ichino, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Masayuki Satoh, Hiroyuki Itabashi, Takashi Murai, Nobuyuki Otsuka
Implementation of Memory Tester Consisting of SRAM-Based Reconfigurable Cells. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2003, pp:28-31 [Conf]
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