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Kenichi Ichino: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Masayuki Arai, Harunobu Kurokawa, Kenichi Ichino, Satoshi Fukumoto, Kazuhiko Iwasaki
    Seed Selection Procedure for LFSR-Based BIST with Multiple Scan Chains and Phase Shifters. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:190-195 [Conf]
  2. Kenichi Ichino, Takeshi Asakawa, Satoshi Fukumoto, Kazuhiko Iwasaki, Seiji Kajihara
    Hybrid BIST Using Partially Rotational Scan. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:379-384 [Conf]
  3. Yuki Yamagata, Kenichi Ichino, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Masayuki Satoh, Hiroyuki Itabashi, Takashi Murai, Nobuyuki Otsuka
    Implementation of Memory Tester Consisting of SRAM-Based Reconfigurable Cells. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2003, pp:28-31 [Conf]

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