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Kevin McCauley: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Vivek Chickermane, Brion L. Keller, Kevin McCauley, Anis Uzzaman
    Practical Aspects of Delay Testing for Nanometer Chips. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2005, pp:470- [Conf]
  2. Pamela S. Gillis, Francis Woytowich, Andrew Ferko, Kevin McCauley
    Low Overhead Delay Testing of ASICS. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:534-542 [Conf]
  3. Pamela S. Gillis, Francis Woytowich, Kevin McCauley, Ulrich Baur
    Delay test of chip I/Os using LSSD boundary scan. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:83-90 [Conf]
  4. Brion L. Keller, Kevin McCauley, Joseph Swenton, James Youngs
    ATPG in practical and non-traditional applications. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:632-640 [Conf]
  5. Bernd Könemann, J. Barlow, Paul Chang, R. Gabrielson, C. Goertz, Brion L. Keller, Kevin McCauley, J. Tischer, Vijay S. Iyengar, Barry K. Rosen, T. Williams
    Delay Test: The Next Frontier for LSSD Test Systems. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:578-587 [Conf]

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