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Publications of Author

1. Vivek Chickermane, Brion L. Keller, Kevin McCauley, Anis Uzzaman
   Practical Aspects of Delay Testing for Nanometer Chips. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2005, pp:470- [Conf]
   
2. Hiroyuki Nakamura, Akio Shirokane, Yoshihito Nishizaki, Anis Uzzaman, Vivek Chickermane, Brion L. Keller, Tsutomu Ube, Yoshihiko Terauchi
   Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test Compression. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2005, pp:156-161 [Conf]
   
3. 
   Is Low Power Testing Necessary? What does the Test Industry Truly Need?. [Citation Graph (, )][DBLP]
   
   
4. 
   A Partially-Exhaustive Gate Transition Fault Model. [Citation Graph (, )][DBLP]
   
   
5. 
   Why is Conventional ATPG Not Sufficient for Advanced Low Power Designs?. [Citation Graph (, )][DBLP]