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Simone Borri: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri
Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders. [Citation Graph (0, 0)][DBLP]
Asian Test Symposium, 2003, pp:250-255 [Conf] - Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan
Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. [Citation Graph (0, 0)][DBLP]
Asian Test Symposium, 2004, pp:266-271 [Conf] - Emmanuel Rondey, Yann Tellier, Simone Borri
A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. [Citation Graph (0, 0)][DBLP]
IOLTW, 2002, pp:251-255 [Conf] - Emmanuel Rondey, Yann Tellier, Simone Borri
A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. [Citation Graph (0, 0)][DBLP]
MTDT, 2002, pp:57-61 [Conf] - Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri
March iC-: An Improved Version of March C- for ADOFs Detection. [Citation Graph (0, 0)][DBLP]
VTS, 2004, pp:129-138 [Conf] - Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. [Citation Graph (0, 0)][DBLP]
J. Electronic Testing, 2005, v:21, n:5, pp:551-561 [Journal] - Simone Borri, Magali Bastian Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. [Citation Graph (0, 0)][DBLP]
J. Electronic Testing, 2005, v:21, n:2, pp:169-179 [Journal] - Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. [Citation Graph (0, 0)][DBLP]
J. Electronic Testing, 2006, v:22, n:3, pp:287-296 [Journal]
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