|
Search the dblp DataBase
Magali Bastian Hage-Hassan:
[Publications]
[Author Rank by year]
[Co-authors]
[Prefers]
[Cites]
[Cited by]
Publications of Author
- Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan
Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2004, pp:266-271 [Conf]
- Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan
Data Retention Fault in SRAM Memories: Analysis and Detection Procedures. [Citation Graph (0, 0)][DBLP] VTS, 2005, pp:183-188 [Conf]
- Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. [Citation Graph (0, 0)][DBLP] J. Electronic Testing, 2005, v:21, n:5, pp:551-561 [Journal]
- Simone Borri, Magali Bastian Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. [Citation Graph (0, 0)][DBLP] J. Electronic Testing, 2005, v:21, n:2, pp:169-179 [Journal]
- Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. [Citation Graph (0, 0)][DBLP] J. Electronic Testing, 2006, v:22, n:3, pp:287-296 [Journal]
Search in 0.001secs, Finished in 0.001secs
|