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Marie-Lise Flottes:
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- Marie-Lise Flottes, Christian Landrault, A. Petitqueux
Design for sequential testability: an internal state reseeding approach for 100 % fault coverage. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2000, pp:404-0 [Conf]
- Marie-Lise Flottes, R. Pires, Bruno Rouzeyre
Alleviating DFT Cost Using Testability Driven HLS. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 1998, pp:46-51 [Conf]
- Marie-Lise Flottes, Julien Pouget, Bruno Rouzeyre
A Heuristic for Test Scheduling at System Level. [Citation Graph (0, 0)][DBLP] DATE, 2002, pp:1124- [Conf]
- Marie-Lise Flottes, Regis Poirier, Bruno Rouzeyre
An Arithmetic Structure for Test Data Horizontal Compression. [Citation Graph (0, 0)][DBLP] DATE, 2004, pp:428-435 [Conf]
- Marie-Lise Flottes, R. Pires, Bruno Rouzeyre, L. Volpe
Scanning Datapaths: A Fast and Effective Partial Scan Selection Technique. [Citation Graph (0, 0)][DBLP] DATE, 1998, pp:921-922 [Conf]
- David Hély, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre
A secure scan design methodology. [Citation Graph (0, 0)][DBLP] DATE, 2006, pp:1177-1178 [Conf]
- Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre
Mutation Sampling Technique for the Generation of Structural Test Data. [Citation Graph (0, 0)][DBLP] DATE, 2005, pp:1022-1023 [Conf]
- Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre
A Novel Parity Bit Scheme for SBox in AES Circuits. [Citation Graph (0, 0)][DBLP] DDECS, 2007, pp:267-271 [Conf]
- Yves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard, Laurent Latorre, Regis Lorival
European Network for Test Education. [Citation Graph (0, 0)][DBLP] DELTA, 2002, pp:230-234 [Conf]
- Marie-Lise Flottes, Regis Poirier, Bruno Rouzeyre
On Using Test Vector Differences for Reducing Test Pin Numbers. [Citation Graph (0, 0)][DBLP] DELTA, 2004, pp:275-280 [Conf]
- Julien Dalmasso, Marie-Lise Flottes, Bruno Rouzeyre
Fitting ATE Channels with Scan Chains: a Comparison between a Test Data Compression Technique and Serial Loading of Scan Chains. [Citation Graph (0, 0)][DBLP] DELTA, 2006, pp:295-300 [Conf]
- Marie-Lise Flottes, Yves Bertrand, L. Balado, E. Lupon, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, N. Pricopi, Hans-Joachim Wunderlich
Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ. [Citation Graph (0, 0)][DBLP] DELTA, 2004, pp:135-139 [Conf]
- Marie-Lise Flottes, D. Hammad, Bruno Rouzeyre
Automatic Synthesis of BISTed Data Paths From High Level Specification. [Citation Graph (0, 0)][DBLP] EDAC-ETC-EUROASIC, 1994, pp:591-598 [Conf]
- Marie-Lise Flottes, Julien Pouget, Bruno Rouzeyre
Power-Constrained Test Scheduling for SoCs Under a "no session" Scheme. [Citation Graph (0, 0)][DBLP] VLSI-SOC, 2001, pp:401-412 [Conf]
- David Hély, Marie-Lise Flottes, Frédéric Bancel, Bruno Rouzeyre, Nicolas Bérard, Michel Renovell
Scan Design and Secure Chip. [Citation Graph (0, 0)][DBLP] IOLTS, 2004, pp:219-226 [Conf]
- David Hély, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre
Secure Scan Techniques: A Comparison. [Citation Graph (0, 0)][DBLP] IOLTS, 2006, pp:119-124 [Conf]
- David Berthelot, Marie-Lise Flottes, Bruno Rouzeyre
BISTing data paths at behavioral level. [Citation Graph (0, 0)][DBLP] ITC, 2000, pp:672-680 [Conf]
- Christian Landrault, Marie-Lise Flottes, Bruno Rouzeyre
Is High-Level Test Synthesis Just Design for Test? [Citation Graph (0, 0)][DBLP] ITC, 1995, pp:294- [Conf]
- Yves Bertrand, Florence Azaïs, Marie-Lise Flottes, Regis Lorival
A Successful Distance-Learning Experience for IC Test Education. [Citation Graph (0, 0)][DBLP] MSE, 1999, pp:20-21 [Conf]
- Yves Bertrand, Marie-Lise Flottes, L. Balado, Joan Figueras, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, N. Pricopi, Hans-Joachim Wunderlich, J.-P. Van der Heyden
Test Engineering Education in Europe: the EuNICE-Test Project. [Citation Graph (0, 0)][DBLP] MSE, 2003, pp:85-86 [Conf]
- Marie-Lise Flottes, R. Pires, Bruno Rouzeyre, L. Volpe
Low Cost Partial Scan Design: A High Level Synthesis Approach. [Citation Graph (0, 0)][DBLP] VTS, 1998, pp:332-340 [Conf]
- Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre
An On-Line Fault Detection Scheme for SBoxes in Secure Circuits. [Citation Graph (0, 0)][DBLP] IOLTS, 2007, pp:57-62 [Conf]
- Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre
A Dependable Parallel Architecture for SBoxes. [Citation Graph (0, 0)][DBLP] ReCoSoC, 2007, pp:132-137 [Conf]
- Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre
Mutation Sampling Technique for the Generation of Structural Test Data [Citation Graph (0, 0)][DBLP] CoRR, 2007, v:0, n:, pp:- [Journal]
Analyzing testability from behavioral to RT level. [Citation Graph (, )][DBLP]
An Integrated Validation Environment for Differential Power Analysis. [Citation Graph (, )][DBLP]
AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis. [Citation Graph (, )][DBLP]
Evaluation of Resistance to Differential Power Analysis: Execution Time Optimizations for Designers. [Citation Graph (, )][DBLP]
Fault modelling and fault equivalence in CMOS technology. [Citation Graph (, )][DBLP]
Improving the Test of NoC-Based SoCs with Help of Compression Schemes. [Citation Graph (, )][DBLP]
Test data compression and TAM design. [Citation Graph (, )][DBLP]
Evaluation of concurrent error detection techniques on the Advanced Encryption Standard. [Citation Graph (, )][DBLP]
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