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Antonis M. Paschalis: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Nikolaos Gaitanis, Panagiotis Kostarakis, Antonis M. Paschalis
    Totally Self Checking reconfigurable duplication system with separate internal fault indication. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1995, pp:316-321 [Conf]
  2. Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian
    An effective BIST scheme for carry-save and carry-propagate array multipliers. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1995, pp:298-302 [Conf]
  3. Ioannis Voyiatzis, Dimitris Nikolos, Antonis M. Paschalis, Constantinos Halatsis, Th. Haniotakis
    An efficient comparative concurrent Built-In Self-Test technique. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1995, pp:309-315 [Conf]
  4. Antonis M. Paschalis, Dimitris Nikolos, Constantine Halatsis
    Efficient Modular Design of TSC Checkers for M-out-of-2M Codes. [Citation Graph (0, 0)][DBLP]
    Aegean Workshop on Computing, 1986, pp:144-155 [Conf]
  5. Mihalis Psarakis, Dimitris Gizopoulos, Miltiadis Hatzimihail, Antonis M. Paschalis, Anand Raghunathan, Srivaths Ravi
    Systematic software-based self-test for pipelined processors. [Citation Graph (0, 0)][DBLP]
    DAC, 2006, pp:393-398 [Conf]
  6. Dimitris Gizopoulos, Nektarios Kranitis, Mihalis Psarakis, Antonis M. Paschalis, Yervant Zorian
    Effective Low Power BIST for Datapaths. [Citation Graph (0, 0)][DBLP]
    DATE, 2000, pp:757- [Conf]
  7. Nektarios Kranitis, A. Merentitis, N. Laoutaris, G. Theodorou, Antonis M. Paschalis, Dimitris Gizopoulos, Constantin Halatsis
    Optimal periodic testing of intermittent faults in embedded pipelined processor applications. [Citation Graph (0, 0)][DBLP]
    DATE, 2006, pp:65-70 [Conf]
  8. Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian
    Effective Software Self-Test Methodology for Processor Cores. [Citation Graph (0, 0)][DBLP]
    DATE, 2002, pp:592-597 [Conf]
  9. Nektarios Kranitis, George Xenoulis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian
    Low-Cost Software-Based Self-Testing of RISC Processor Cores. [Citation Graph (0, 0)][DBLP]
    DATE, 2003, pp:10714-10719 [Conf]
  10. Antonis M. Paschalis, Dimitris Gizopoulos
    Effective Software-Based Self-Test Strategies for On-Line Periodic Testing of Embedded Processors. [Citation Graph (0, 0)][DBLP]
    DATE, 2004, pp:578-583 [Conf]
  11. Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Mihalis Psarakis, Yervant Zorian
    Deterministic software-based self-testing of embedded processor cores. [Citation Graph (0, 0)][DBLP]
    DATE, 2001, pp:92-96 [Conf]
  12. Antonis M. Paschalis, Nektarios Kranitis, Mihalis Psarakis, Dimitris Gizopoulos, Yervant Zorian
    An Effective BIST Architecture for Fast Multiplier Cores. [Citation Graph (0, 0)][DBLP]
    DATE, 1999, pp:117-121 [Conf]
  13. Miltiadis Hatzimihail, Mihalis Psarakis, George Xenoulis, Dimitris Gizopoulos, Antonis M. Paschalis
    Software-Based Self-Test for Pipelined Processors: A Case Study. [Citation Graph (0, 0)][DBLP]
    DFT, 2005, pp:535-543 [Conf]
  14. Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis
    Accumulator-Based Weighted Pattern Generation. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2005, pp:215-220 [Conf]
  15. George Xenoulis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis
    Test Generation Methodology for High-Speed Floating Point Adders. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2005, pp:227-232 [Conf]
  16. George Xenoulis, Dimitris Gizopoulos, Nektarios Kranitis, Antonis M. Paschalis
    Low-Cost, On-Line Software-Based Self-Testing of Embedded Processor Cores. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2003, pp:149-0 [Conf]
  17. P. Kenterlis, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, Mihalis Psarakis
    A Low-Cost SEU Fault Emulation Platform for SRAM-Based FPGAs. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2006, pp:235-241 [Conf]
  18. Nektarios Kranitis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian
    An Effective Deterministic BIST Scheme for Shifter/Accumulator Pairs in Datapaths. [Citation Graph (0, 0)][DBLP]
    ISQED, 2001, pp:343-349 [Conf]
  19. Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian
    An Effective BIST Scheme for Booth Multipliers. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:824-833 [Conf]
  20. Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian
    An Effective BIST Scheme for Datapaths. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:76-85 [Conf]
  21. Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian, Mihalis Psarakis
    An Effective BIST Scheme for Arithmetic Logic Units. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:868-877 [Conf]
  22. Nektarios Kranitis, George Xenoulis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian
    Application and Analysis of RT-Level Software-Based Self-Testing for Embedded Processor Cores. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:431-440 [Conf]
  23. Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Nikolos, Constantinos Halatsis
    R-CBIST: an effective RAM-based input vector monitoring concurrent BIST technique. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:918-925 [Conf]
  24. Nikolaos Gaitanis, Dimitris Gizopoulos, Antonis M. Paschalis, Panagiotis Kostarakis
    An asynchronous totally self-checking two-rail code error indicator. [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:151-156 [Conf]
  25. Dimitris Gizopoulos, Dimitris Nikolos, Antonis M. Paschalis
    Testing combinational iterative logic arrays for realistic faults. [Citation Graph (0, 0)][DBLP]
    VTS, 1995, pp:35-41 [Conf]
  26. Dimitris Gizopoulos, Nektarios Kranitis, Mihalis Psarakis, Antonis M. Paschalis, Yervant Zorian
    Low Power/Energy BIST Scheme for Datapaths. [Citation Graph (0, 0)][DBLP]
    VTS, 2000, pp:23-28 [Conf]
  27. Dimitris Gizopoulos, Mihalis Psarakis, Antonis M. Paschalis
    Robust Sequential Fault Testing of Iterative Logic Arrays. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:238-244 [Conf]
  28. Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian
    Instruction-Based Self-Testing of Processor Cores. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:223-228 [Conf]
  29. Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian
    Robustly Testable Array Multipliers under Realistic Sequential Cell Fault Model. [Citation Graph (0, 0)][DBLP]
    VTS, 1998, pp:152-157 [Conf]
  30. Mihalis Psarakis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian
    An Effective BIST Architecture for Sequential Fault Testing in Array Multipliers. [Citation Graph (0, 0)][DBLP]
    VTS, 1999, pp:252-259 [Conf]
  31. Mihalis Psarakis, Antonis M. Paschalis, Nektarios Kranitis, Dimitris Gizopoulos, Yervant Zorian
    Robust and Low-Cost BIST Architectures for Sequential Fault Testing in Datapath Multipliers. [Citation Graph (0, 0)][DBLP]
    VTS, 2001, pp:15-21 [Conf]
  32. Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian
    Effective Built-In Self-Test for Booth Multipliers. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:105-111 [Journal]
  33. Nektarios Kranitis, Dimitris Gizopoulos, Antonis M. Paschalis, Mihalis Psarakis, Yervant Zorian
    Power-/Energy Efficient BIST Schemes for Processor Data Paths. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:4, pp:15-28 [Journal]
  34. Dimitris Gizopoulos, Dimitris Nikolos, Antonis M. Paschalis
    Testing CMOS combinational iterative logic arrays for realistic faults. [Citation Graph (0, 0)][DBLP]
    Integration, 1996, v:21, n:3, pp:209-228 [Journal]
  35. Vassilios V. Dimakopoulos, G. Sourtziotis, Antonis M. Paschalis, Dimitris Nikolos
    On TSC Checkers for m-out-n Codes. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1995, v:44, n:8, pp:1055-1059 [Journal]
  36. Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian
    An Effective Built-In Self-Test Scheme for Parallel Multipliers. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1999, v:48, n:9, pp:936-950 [Journal]
  37. Th. Haniotakis, Antonis M. Paschalis, Dimitris Nikolos
    Efficient Totally Self-Checking Checkers for a Class of Borden Codes. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1995, v:44, n:11, pp:1318-1322 [Journal]
  38. Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, George Xenoulis
    Software-Based Self-Testing of Embedded Processors. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 2005, v:54, n:4, pp:461-475 [Journal]
  39. Dimitris Nikolos, Antonis M. Paschalis, George Philokyprou
    Efficient Design of Totally Self-Checking Checkers for all Low-Cost Arithmetic Codes. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1988, v:37, n:7, pp:807-814 [Journal]
  40. Antonis M. Paschalis, Costas Efstathiou, Constantine Halatsis
    An Efficient TSC 1-out-of-3 Code Checker. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1990, v:39, n:3, pp:407-411 [Journal]
  41. Antonis M. Paschalis, Dimitris Nikolos, Constantine Halatsis
    Efficient Modular Design of TSC Checkers for M-out-of-2M Codes. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1988, v:37, n:3, pp:301-309 [Journal]
  42. Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian
    Sequential Fault Modeling and Test Pattern Generation for CMOS Iterative Logic Arrays. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 2000, v:49, n:10, pp:1083-1099 [Journal]
  43. George Xenoulis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis
    Testability Analysis and Scalable Test Generation for High-Speed Floating-Point Units. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 2006, v:55, n:11, pp:1449-1457 [Journal]
  44. Antonis M. Paschalis, Dimitris Gizopoulos
    Effective software-based self-test strategies for on-line periodic testing of embedded processors. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:1, pp:88-99 [Journal]
  45. Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis
    Built-in sequential fault self-testing of array multipliers. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:3, pp:449-460 [Journal]
  46. Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis
    Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2005, v:13, n:9, pp:1079-1086 [Journal]
  47. A. Apostolakis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis
    A Functional Self-Test Approach for Peripheral Cores in Processor-Based SoCs. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2007, pp:271-276 [Conf]
  48. A. Merentitis, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos
    Selecting Power-Optimal SBST Routines for On-Line Processor Testing. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2007, pp:111-116 [Conf]
  49. Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Constantin Halatsis
    A concurrent built-in self-test architecture based on a self-testing RAM. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:69-78 [Journal]
  50. A. Apostolakis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis
    Functional Processor-Based Testing of Communication Peripherals in Systems-on-Chip. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2007, v:15, n:8, pp:971-975 [Journal]

  51. Functional Self-Testing for Bus-Based Symmetric Multiprocessors. [Citation Graph (, )][DBLP]


  52. A totally self-checking 1-out-of-3 code error indicator. [Citation Graph (, )][DBLP]


  53. On-Line Periodic Self-Testing of High-Speed Floating-Point Units in Microprocessors. [Citation Graph (, )][DBLP]


  54. An Input Vector Monitoring Concurrent BIST scheme exploiting . [Citation Graph (, )][DBLP]


  55. Exploiting Thread-Level Parallelism in Functional Self-Testing of CMT Processors. [Citation Graph (, )][DBLP]


  56. Hybrid-SBST Methodology for Efficient Testing of Processor Cores. [Citation Graph (, )][DBLP]


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