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Achintya Halder: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Achintya Halder, Abhijit Chatterjee
    Specification Based Digital Compatible Built-in Test of Embedded Analog Circuits. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:344-0 [Conf]
  2. Achintya Halder, Abhijit Chatterjee
    Low-cost Production Test of BER for Wireless Receivers. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2005, pp:64-69 [Conf]
  3. Achintya Halder, Abhijit Chatterjee
    Automated Test Generation and Test Point Selection for Specification Test of Analog Circuits. [Citation Graph (0, 0)][DBLP]
    ISQED, 2004, pp:401-406 [Conf]
  4. Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee
    Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:665-673 [Conf]
  5. Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee
    A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2005, pp:289-294 [Conf]
  6. Achintya Halder, Abhijit Chatterjee
    Low-Cost Production Testing of Wireless Transmitters. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2006, pp:437-442 [Conf]
  7. Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee
    System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:229-236 [Conf]
  8. Achintya Halder, Abhijit Chatterjee
    Low-Cost Alternate EVM Test for Wireless Receiver Systems. [Citation Graph (0, 0)][DBLP]
    VTS, 2005, pp:255-260 [Conf]
  9. Achintya Halder, Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley
    Measuring Stray Capacitance on Tester Hardware. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:351-356 [Conf]
  10. Achintya Halder, Abhijit Chatterjee
    Test generation for specification test of analog circuits using efficient test response observation methods. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:9, pp:820-832 [Journal]
  11. Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee
    Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:3, pp:323-339 [Journal]

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