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Mike Rodgers: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Said Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mike Rodgers
    March SL: A Test For All Static Linked Memory Faults. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2003, pp:372-377 [Conf]
  2. Said Hamdioui, A. J. van de Goor, David Eastwick, Mike Rodgers
    Detecting Unique Faults in Multi-port SRAMs. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:37-42 [Conf]
  3. Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik Roy
    Test challenges for deep sub-micron technologies. [Citation Graph (0, 0)][DBLP]
    DAC, 2000, pp:142-149 [Conf]
  4. Yervant Zorian, Sujit Dey, Mike Rodgers
    Test of Future System-on-Chips. [Citation Graph (0, 0)][DBLP]
    ICCAD, 2000, pp:392-398 [Conf]
  5. Mike Rodgers
    Defect screening challenges in the Gigahertz/Nanometer age: keeping up with the tails of defect behaviors. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:464-467 [Conf]
  6. Said Hamdioui, A. J. van de Goor, David Eastwick, Mike Rodgers
    Realistic Fault Models and Test Procedures for Multi-Port SRAMs. [Citation Graph (0, 0)][DBLP]
    MTDT, 2001, pp:65-72 [Conf]
  7. Said Hamdioui, A. J. van de Goor, Mike Rodgers
    March SS: A Test for All Static Simple RAM Faults. [Citation Graph (0, 0)][DBLP]
    MTDT, 2002, pp:95-100 [Conf]
  8. Said Hamdioui, A. J. van de Goor, Mike Rodgers, David Eastwick
    March Tests for Realistic Faults in Two-Port Memories. [Citation Graph (0, 0)][DBLP]
    MTDT, 2000, pp:73-78 [Conf]
  9. Said Hamdioui, A. J. van de Goor, Mike Rodgers
    Detecting Intra-Word Faults in Word-Oriented Memories. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:241-247 [Conf]
  10. Ajay Khoche, Mike Rodgers, Pete O'Neil
    Session Abstract. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:426- [Conf]
  11. Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers
    Debating the Future of Burn-In. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:311-314 [Conf]
  12. Mike Rodgers
    ITRS Test Chapter 2001: We'll Tell You What We're Doing, You Tell Us What We Should Be Doing. [Citation Graph (0, 0)][DBLP]
    VTS, 2001, pp:155-157 [Conf]
  13. Alan Allan, Don Edenfeld, William H. Joyner Jr., Andrew B. Kahng, Mike Rodgers, Yervant Zorian
    2001 Technology Roadmap for Semiconductors. [Citation Graph (0, 0)][DBLP]
    IEEE Computer, 2002, v:35, n:1, pp:42-53 [Journal]
  14. Don Edenfeld, Andrew B. Kahng, Mike Rodgers, Yervant Zorian
    2003 Technology Roadmap for Semiconductors. [Citation Graph (0, 0)][DBLP]
    IEEE Computer, 2004, v:37, n:1, pp:47-56 [Journal]
  15. Said Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mike Rodgers
    Linked faults in random access memories: concept, fault models, test algorithms, and industrial results. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:5, pp:737-757 [Journal]

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