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Mike Rodgers :
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Said Hamdioui , Zaid Al-Ars , A. J. van de Goor , Mike Rodgers March SL: A Test For All Static Linked Memory Faults. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 2003, pp:372-377 [Conf ] Said Hamdioui , A. J. van de Goor , David Eastwick , Mike Rodgers Detecting Unique Faults in Multi-port SRAMs. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 2001, pp:37-42 [Conf ] Kwang-Ting Cheng , Sujit Dey , Mike Rodgers , Kaushik Roy Test challenges for deep sub-micron technologies. [Citation Graph (0, 0)][DBLP ] DAC, 2000, pp:142-149 [Conf ] Yervant Zorian , Sujit Dey , Mike Rodgers Test of Future System-on-Chips. [Citation Graph (0, 0)][DBLP ] ICCAD, 2000, pp:392-398 [Conf ] Mike Rodgers Defect screening challenges in the Gigahertz/Nanometer age: keeping up with the tails of defect behaviors. [Citation Graph (0, 0)][DBLP ] ITC, 2000, pp:464-467 [Conf ] Said Hamdioui , A. J. van de Goor , David Eastwick , Mike Rodgers Realistic Fault Models and Test Procedures for Multi-Port SRAMs. [Citation Graph (0, 0)][DBLP ] MTDT, 2001, pp:65-72 [Conf ] Said Hamdioui , A. J. van de Goor , Mike Rodgers March SS: A Test for All Static Simple RAM Faults. [Citation Graph (0, 0)][DBLP ] MTDT, 2002, pp:95-100 [Conf ] Said Hamdioui , A. J. van de Goor , Mike Rodgers , David Eastwick March Tests for Realistic Faults in Two-Port Memories. [Citation Graph (0, 0)][DBLP ] MTDT, 2000, pp:73-78 [Conf ] Said Hamdioui , A. J. van de Goor , Mike Rodgers Detecting Intra-Word Faults in Word-Oriented Memories. [Citation Graph (0, 0)][DBLP ] VTS, 2003, pp:241-247 [Conf ] Ajay Khoche , Mike Rodgers , Pete O'Neil Session Abstract. [Citation Graph (0, 0)][DBLP ] VTS, 2006, pp:426- [Conf ] Edward J. McCluskey , Subhasish Mitra , Bob Madge , Peter C. Maxwell , Phil Nigh , Mike Rodgers Debating the Future of Burn-In. [Citation Graph (0, 0)][DBLP ] VTS, 2002, pp:311-314 [Conf ] Mike Rodgers ITRS Test Chapter 2001: We'll Tell You What We're Doing, You Tell Us What We Should Be Doing. [Citation Graph (0, 0)][DBLP ] VTS, 2001, pp:155-157 [Conf ] Alan Allan , Don Edenfeld , William H. Joyner Jr. , Andrew B. Kahng , Mike Rodgers , Yervant Zorian 2001 Technology Roadmap for Semiconductors. [Citation Graph (0, 0)][DBLP ] IEEE Computer, 2002, v:35, n:1, pp:42-53 [Journal ] Don Edenfeld , Andrew B. Kahng , Mike Rodgers , Yervant Zorian 2003 Technology Roadmap for Semiconductors. [Citation Graph (0, 0)][DBLP ] IEEE Computer, 2004, v:37, n:1, pp:47-56 [Journal ] Said Hamdioui , Zaid Al-Ars , A. J. van de Goor , Mike Rodgers Linked faults in random access memories: concept, fault models, test algorithms, and industrial results. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:5, pp:737-757 [Journal ] Search in 0.038secs, Finished in 0.039secs