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Donghoon Han: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Donghoon Han, Abhijit Chatterjee
    Device Resizing Based Optimization of Analog Circuits for Reduced Test Cost: Cost Metric and Case Study. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:420-425 [Conf]
  2. Donghoon Han, Abhijit Chatterjee
    Robust Built-In Test of RF ICs Using Envelope Detectors. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2005, pp:2-7 [Conf]
  3. Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt
    On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). [Citation Graph (0, 0)][DBLP]
    IOLTS, 2005, pp:106-111 [Conf]
  4. Donghoon Han, Abhijit Chatterjee
    Simulation-in-the-Loop Analog Circuit Sizing Method using Adaptive Model-based Simulated Annealing. [Citation Graph (0, 0)][DBLP]
    IWSOC, 2004, pp:127-130 [Conf]
  5. Hyun Choi, Donghoon Han, Abhijit Chatterjee
    Enhanced Resolution Jitter Testing Using Jitter Expansion. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:104-109 [Conf]
  6. Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee
    Low Cost Parametric Failure Diagnosis of RF Transceivers. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2006, pp:205-212 [Conf]

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