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Title:
Author:
Janak H. Patel: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. John W. C. Fu, Janak H. Patel
    Data Prefetching in Multiprocessor Vector Cache Memories. [Citation Graph (1, 0)][DBLP]
    ISCA, 1991, pp:54-63 [Conf]
  2. David W. L. Yen, Janak H. Patel, Edward S. Davidson
    Memory Interference in Synchronous Multiprocessor Systems. [Citation Graph (1, 0)][DBLP]
    IEEE Trans. Computers, 1982, v:31, n:11, pp:1116-1121 [Journal]
  3. Eiji Harada, Janak H. Patel
    Overhead reduction techniques for hierarchical fault simulation. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1995, pp:79-85 [Conf]
  4. Jacob A. Abraham, Sandip Kundu, Janak H. Patel, Manuel A. d'Abreu, Bulent I. Dervisoglu, Marc E. Levitt, Hector R. Sucar, Ron G. Walther
    Microprocessor Testing: Which Technique is Best? (Panel). [Citation Graph (0, 0)][DBLP]
    DAC, 1994, pp:294- [Conf]
  5. Susheel J. Chandra, Janak H. Patel
    A Hierarchical Approach Test Vector Generation. [Citation Graph (0, 0)][DBLP]
    DAC, 1987, pp:495-501 [Conf]
  6. Vivek Chickermane, Elizabeth M. Rudnick, Prithviraj Banerjee, Janak H. Patel
    Non-Scan Design-for-Testability Techniques for Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    DAC, 1993, pp:236-241 [Conf]
  7. U. J. Davé, Janak H. Patel
    A Functional-Level Test Generation Methodology Using Two-level Representations. [Citation Graph (0, 0)][DBLP]
    DAC, 1989, pp:722-725 [Conf]
  8. SungHo Kim, Prithviraj Banerjee, Vivek Chickermane, Janak H. Patel
    APT: An Area-Performance-Testability Driven Placement Algorithm. [Citation Graph (0, 0)][DBLP]
    DAC, 1992, pp:141-146 [Conf]
  9. Jaushin Lee, Janak H. Patel
    Hierarchical Test Generation under Intensive Global Functional Constraints. [Citation Graph (0, 0)][DBLP]
    DAC, 1992, pp:261-266 [Conf]
  10. Pinaki Mazumder, Janak H. Patel, W. Kent Fuchs
    Design and Algorithms for Parallel Testing of Random Access and Content Addressable Memories. [Citation Graph (0, 0)][DBLP]
    DAC, 1987, pp:689-694 [Conf]
  11. Thomas M. Niermann, Wu-Tung Cheng, Janak H. Patel
    Proofs: A Fast, Memory Efficient Sequential Circuit Fault Simulator. [Citation Graph (0, 0)][DBLP]
    DAC, 1990, pp:535-540 [Conf]
  12. Steven Parkes, Prithviraj Banerjee, Janak H. Patel
    ProperHITEC: A Portable, Parallel, Object-Oriented Approach to Sequential Test Generation. [Citation Graph (0, 0)][DBLP]
    DAC, 1994, pp:717-721 [Conf]
  13. Sanjay J. Patel, Janak H. Patel
    Effectiveness of heuristics measures for automatic test pattern generation. [Citation Graph (0, 0)][DBLP]
    DAC, 1986, pp:547-552 [Conf]
  14. Srinivas Patil, Prithviraj Banerjee, Janak H. Patel
    Parallel Test Generation for Sequential Circuits on General-Purpose Multiprocessors. [Citation Graph (0, 0)][DBLP]
    DAC, 1991, pp:155-159 [Conf]
  15. Elizabeth M. Rudnick, Janak H. Patel
    Combining Deterministic and Genetic Approaches for Sequential Circuit Test Generation. [Citation Graph (0, 0)][DBLP]
    DAC, 1995, pp:183-188 [Conf]
  16. Elizabeth M. Rudnick, Janak H. Patel, Gary S. Greenstein, Thomas M. Niermann
    Sequential Circuit Test Generation in a Genetic Algorithm Framework. [Citation Graph (0, 0)][DBLP]
    DAC, 1994, pp:698-704 [Conf]
  17. Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs, Elizabeth M. Rudnick, Sreejit Chakravarty, Janak H. Patel
    Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists. [Citation Graph (0, 0)][DBLP]
    DAC, 1995, pp:133-138 [Conf]
  18. Dong Xiang, Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel
    Partial Scan Design Based on Circuit State Information. [Citation Graph (0, 0)][DBLP]
    DAC, 1996, pp:807-812 [Conf]
  19. Amit R. Pandey, Janak H. Patel
    An Incremental Algorithm for Test Generation in Illinois Scan Architecture Based Designs. [Citation Graph (0, 0)][DBLP]
    DATE, 2002, pp:368-375 [Conf]
  20. Elizabeth M. Rudnick, John G. Holm, Daniel G. Saab, Janak H. Patel
    Application of Simple Genetic Algorithms to Sequential Circuit Test Generation. [Citation Graph (0, 0)][DBLP]
    EDAC-ETC-EUROASIC, 1994, pp:40-45 [Conf]
  21. Hungse Cha, Elizabeth M. Rudnick, Gwan S. Choi, Janak H. Patel, Ravishankar K. Iyer
    A Fast and Accurate Gate-Level Transient Fault Simulation Environment. [Citation Graph (0, 0)][DBLP]
    FTCS, 1993, pp:310-319 [Conf]
  22. Ilker Hamzaoglu, Janak H. Patel
    Reducing Test Application Time for Full Scan Embedded Cores. [Citation Graph (0, 0)][DBLP]
    FTCS, 1999, pp:260-267 [Conf]
  23. Jaushin Lee, Janak H. Patel
    An Architectural Level Test Generator for a Hierarchical Design Environment. [Citation Graph (0, 0)][DBLP]
    FTCS, 1991, pp:44-51 [Conf]
  24. Irith Pomeranz, Sudhakar M. Reddy, Janak H. Patel
    Theory and Practice of Sequential Machine Testing and Testability. [Citation Graph (0, 0)][DBLP]
    FTCS, 1993, pp:330-337 [Conf]
  25. Gurjeet S. Saund, Michael S. Hsiao, Janak H. Patel
    Partial Scan beyond Cycle Cutting. [Citation Graph (0, 0)][DBLP]
    FTCS, 1997, pp:320-328 [Conf]
  26. Paul J. Thadikaran, Sreejit Chakravarty, Janak H. Patel
    Fault Simulation ofIDDQ Tests for Bridging Faults in Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    FTCS, 1995, pp:340-349 [Conf]
  27. Irith Pomeranz, Sudhakar M. Reddy, Janak H. Patel
    On Double Transition Faults as a Delay Fault Model. [Citation Graph (0, 0)][DBLP]
    Great Lakes Symposium on VLSI, 1996, pp:282-287 [Conf]
  28. John W. C. Fu, Janak H. Patel
    Trace Driven Simulation using Sampled Traces. [Citation Graph (0, 0)][DBLP]
    HICSS (1), 1994, pp:211-220 [Conf]
  29. Vivek Chickermane, Jaushin Lee, Janak H. Patel
    A comparative study of design for testability methods using high-level and gate-level descriptions. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1992, pp:620-624 [Conf]
  30. Vivek Chickermane, Janak H. Patel
    A Fault Oriented Partial Scan Design Approach. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1991, pp:400-403 [Conf]
  31. Abhijit Dharchoudhury, Sung-Mo Kang, H. Cha, J. H. Patel
    Fast timing simulation of transient faults in digital circuits. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1994, pp:719-722 [Conf]
  32. Gary S. Greenstein, Janak H. Patel
    E-PROOFS: a CMOS bridging fault simulator. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1992, pp:268-271 [Conf]
  33. Ilker Hamzaoglu, Janak H. Patel
    Deterministic Test Pattern Generation Techniques for Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    ICCAD, 2000, pp:538-543 [Conf]
  34. Ilker Hamzaoglu, Janak H. Patel
    Test set compaction algorithms for combinational circuits. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1998, pp:283-289 [Conf]
  35. Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal
    SIGMA: a simulator for segment delay faults. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1996, pp:502-508 [Conf]
  36. Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal
    Fast identification of untestable delay faults using implications. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1997, pp:642-647 [Conf]
  37. Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
    Effects of delay models on peak power estimation of VLSI sequential circuits. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1997, pp:45-51 [Conf]
  38. Frank F. Hsu, Janak H. Patel
    High-level variable selection for partial-scan implementation. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1998, pp:79-84 [Conf]
  39. Frank F. Hsu, Elizabeth M. Rudnick, Janak H. Patel
    Enhancing high-level control-flow for improved testability. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1996, pp:322-328 [Conf]
  40. Jaushin Lee, Janak H. Patel
    A Signal-Driven Discrete Relaxation Technique for Architectural Level Test Generation. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1991, pp:458-461 [Conf]
  41. Rabindra K. Roy, Abhijit Chatterjee, Janak H. Patel, Jacob A. Abraham, Manuel A. d'Abreu
    Automatic test generation for linear digital systems with bi-level search using matrix transform methods. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1992, pp:224-228 [Conf]
  42. Elizabeth M. Rudnick, Thomas M. Niermann, Janak H. Patel
    Methods for Reducing Events in Sequential Circuit Fault Simulation. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1991, pp:546-549 [Conf]
  43. Elizabeth M. Rudnick, Janak H. Patel
    Simulation-based techniques for dynamic test sequence compaction. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1996, pp:67-73 [Conf]
  44. Hungse Cha, Janak H. Patel
    A Logic-Level Model for alpha-Paricle Hits in CMOS Circuits. [Citation Graph (0, 0)][DBLP]
    ICCD, 1993, pp:538-542 [Conf]
  45. Hungse Cha, Janak H. Patel
    Latch Design for Transient Pulse Tolerance. [Citation Graph (0, 0)][DBLP]
    ICCD, 1994, pp:385-388 [Conf]
  46. Michael S. Hsiao, Janak H. Patel
    A new architectural-level fault simulation using propagation prediction of grouped fault-effects. [Citation Graph (0, 0)][DBLP]
    ICCD, 1995, pp:628-0 [Conf]
  47. Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng
    Hardware Ef.cient LBISTWith Complementary Weights. [Citation Graph (0, 0)][DBLP]
    ICCD, 2005, pp:479-484 [Conf]
  48. Steven Parkes, Prithviraj Banerjee, Janak H. Patel
    A parallel algorithm for fault simulation based on PROOFS . [Citation Graph (0, 0)][DBLP]
    ICCD, 1995, pp:616-0 [Conf]
  49. Santosh G. Abraham, Janak H. Patel
    Parallel Garbage Collection on a Virtual Memory System. [Citation Graph (0, 0)][DBLP]
    ICPP, 1987, pp:243-246 [Conf]
  50. Jeff Baxter, Janak H. Patel
    The LAST Algorithm: A Heuristic-Based Static Task Allocation Algorithm. [Citation Graph (0, 0)][DBLP]
    ICPP (2), 1989, pp:217-222 [Conf]
  51. Jeff Baxter, Balkrishna Ramkumar, Janak H. Patel
    Compile Time Parallel Resource Allocation for Unbounded Tree Structure Task Graphs. [Citation Graph (0, 0)][DBLP]
    ICPP (1), 1992, pp:202-209 [Conf]
  52. Alok N. Choudhary, Janak H. Patel
    A Parallel Processing Architecture for an Integrated Vision System. [Citation Graph (0, 0)][DBLP]
    ICPP (1), 1988, pp:383-387 [Conf]
  53. Alok N. Choudhary, Janak H. Patel
    Performance Evaluation of Clusters of NETRA: An Architecture for Computer Vision Systems. [Citation Graph (0, 0)][DBLP]
    ICPP (1), 1990, pp:494-497 [Conf]
  54. John W. C. Fu, Janak H. Patel
    Memory Reference Behavior of Compiler Optimized Programs on High Speed. [Citation Graph (0, 0)][DBLP]
    ICPP, 1993, pp:87-94 [Conf]
  55. Kun-Lung Wu, W. Kent Fuchs, Janak H. Patel
    Cache-Based Error Recovery for Shared Memory Multiprocessor Systems. [Citation Graph (0, 0)][DBLP]
    ICPP (1), 1989, pp:159-166 [Conf]
  56. Ravishankar K. Iyer, William H. Sanders, Janak H. Patel, Zbigniew Kalbarczyk
    The evolution of dependable computing at the University of Illinois. [Citation Graph (0, 0)][DBLP]
    IFIP Congress Topical Sessions, 2004, pp:135-164 [Conf]
  57. John W. C. Fu, Janak H. Patel
    Data Prefetching Strategies for Vector Cache Memories. [Citation Graph (0, 0)][DBLP]
    IPPS, 1991, pp:555-560 [Conf]
  58. Jeff Baxter, Janak H. Patel
    Profiling Based Task Migration. [Citation Graph (0, 0)][DBLP]
    IPPS, 1992, pp:192-195 [Conf]
  59. Jeff Baxter, John W. C. Fu, Balkrishna Ramkumar, Janak H. Patel
    Hybrid Resource Management Algorithms for Multicomputer Systems. [Citation Graph (0, 0)][DBLP]
    IPPS, 1994, pp:482-489 [Conf]
  60. Alfred Brenner, Richard F. Freund, R. Stockton Gaines, Rob Kelly, Louis Lome, Richard McAndrew, Alexandru Nicolau, Janak H. Patel, Thomas Probert, John H. Reif, Jorge L. C. Sanz, Howard Jay Siegel, Jon A. Webb
    How Do We Make Parallel Processing a Reality? Bridging the Gap Between Theory and Practice. [Citation Graph (0, 0)][DBLP]
    IPPS, 1991, pp:648-653 [Conf]
  61. Richard J. Eickemeyer, Janak H. Patel
    Performance Evaluation of Multiple Register Sets. [Citation Graph (0, 0)][DBLP]
    ISCA, 1987, pp:264-271 [Conf]
  62. Richard J. Eickemeyer, Janak H. Patel
    Performance Evaluation of On-Chip Register and Cache Organizations. [Citation Graph (0, 0)][DBLP]
    ISCA, 1988, pp:64-72 [Conf]
  63. Mohammad Malkawi, Janak H. Patel
    Performance Measurement of Paging Behavior in Multiprogramming Systems. [Citation Graph (0, 0)][DBLP]
    ISCA, 1986, pp:111-118 [Conf]
  64. Mark S. Papamarcos, Janak H. Patel
    A Low-Overhead Coherence Solution for Multiprocessors with Private Cache Memories. [Citation Graph (0, 0)][DBLP]
    ISCA, 1984, pp:348-354 [Conf]
  65. Mark S. Papamarcos, Janak H. Patel
    A Low-Overhead Coherence Solution for Multiprocessors with Private Cache Memories. [Citation Graph (0, 0)][DBLP]
    25 Years ISCA: Retrospectives and Reprints, 1998, pp:284-290 [Conf]
  66. Janak H. Patel
    Pipelines wth Internal Buffers. [Citation Graph (0, 0)][DBLP]
    ISCA, 1978, pp:249-255 [Conf]
  67. Janak H. Patel
    Processor-Memory Interconnections for Multiprocessors. [Citation Graph (0, 0)][DBLP]
    ISCA, 1979, pp:168-177 [Conf]
  68. Janak H. Patel
    Retrospective: Improving the Throughput of a Pipeline by Insertion of Delays. [Citation Graph (0, 0)][DBLP]
    25 Years ISCA: Retrospectives and Reprints, 1998, pp:5- [Conf]
  69. Janak H. Patel
    Retrospective: A Low-Overhead Coherence Solution for Multiprocessors with Private Cache Memories. [Citation Graph (0, 0)][DBLP]
    25 Years ISCA: Retrospectives and Reprints, 1998, pp:39-41 [Conf]
  70. Janak H. Patel, Edward S. Davidson
    Improving the Throughput of a Pipeline by Insertion of Delays. [Citation Graph (0, 0)][DBLP]
    ISCA, 1976, pp:159-164 [Conf]
  71. Janak H. Patel, Edward S. Davidson
    Improving the Throughput of a Pipeline by Insertion of Delays. [Citation Graph (0, 0)][DBLP]
    25 Years ISCA: Retrospectives and Reprints, 1998, pp:132-137 [Conf]
  72. Ashwin Ram, Janak H. Patel
    Parallel Garbage Collection Without Synchronization Overhead. [Citation Graph (0, 0)][DBLP]
    ISCA, 1985, pp:84-90 [Conf]
  73. Gurindar S. Sohi, Edward S. Davidson, Janak H. Patel
    An Efficient LISP-Execution Architecture with a New Representation for List Structures. [Citation Graph (0, 0)][DBLP]
    ISCA, 1985, pp:91-98 [Conf]
  74. Phil C. C. Yeh, Janak H. Patel, Edward S. Davidson
    Performance of Shared Cache for Parallel-Pipelined Computer Systems [Citation Graph (0, 0)][DBLP]
    ISCA, 1983, pp:117-123 [Conf]
  75. Pi-Yu Chung, Ibrahim N. Hajj, Janak H. Patel
    Efficient Variable Ordering Heuristics for Shared ROBDD. [Citation Graph (0, 0)][DBLP]
    ISCAS, 1993, pp:1690-1693 [Conf]
  76. Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
    K2: an estimator for peak sustainable power of VLSI circuits. [Citation Graph (0, 0)][DBLP]
    ISLPED, 1997, pp:178-183 [Conf]
  77. Frank F. Hsu, Elizabeth M. Rudnick, Janak H. Patel
    Testability Insertion in Behavioral Descriptions. [Citation Graph (0, 0)][DBLP]
    ISSS, 1996, pp:139-144 [Conf]
  78. Mihir A. Shah, Janak H. Patel
    Enhancement of the Illinois Scan Architecture for Use with Multiple Scan Inputs. [Citation Graph (0, 0)][DBLP]
    ISVLSI, 2004, pp:167-172 [Conf]
  79. Wu-Tung Cheng, Janak H. Patel
    Multiple-Fault Detection in Iterative Logic Arrays. [Citation Graph (0, 0)][DBLP]
    ITC, 1985, pp:493-499 [Conf]
  80. Vivek Chickermane, Jaushin Lee, Janak H. Patel
    Design for Testability Using Architectural Descriptions. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:752-761 [Conf]
  81. James P. Cusey, Janak H. Patel
    BART: A Bridging Fault Test Generation for Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:838-847 [Conf]
  82. Ramaswami Dandapani, Janak H. Patel, Jacob A. Abraham
    Design of Test Pattern Generators for Built-In Test. [Citation Graph (0, 0)][DBLP]
    ITC, 1984, pp:315-319 [Conf]
  83. Ilker Hamzaoglu, Janak H. Patel
    Compact two-pattern test set generation for combinational and full scan circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:944-953 [Conf]
  84. Frank F. Hsu, Kenneth M. Butler, Janak H. Patel
    A case study on the implementation of the Illinois Scan Architecture. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:538-547 [Conf]
  85. Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng
    Logic BIST with Scan Chain Segmentation. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:57-66 [Conf]
  86. Jaushin Lee, Janak H. Patel
    ARTEST: An Architectural Level Test Generator for Data Path Faults and Control Faults. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:729-738 [Conf]
  87. Jaushin Lee, Janak H. Patel
    An Instruction Sequence Assembling Methodology for Testing Microprocessors. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:49-58 [Conf]
  88. Jeff Rearick, Janak H. Patel
    Fast and Accurate CMOS Bridging Fault Simulation. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:54-62 [Conf]
  89. Elizabeth M. Rudnick, W. Kent Fuchs, Janak H. Patel
    Diagnostic Fault Simulation of Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:178-186 [Conf]
  90. Elizabeth M. Rudnick, Janak H. Patel
    Putting the Squeeze on Test Sequences. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:723-732 [Conf]
  91. Elizabeth M. Rudnick, Janak H. Patel, Irith Pomeranz
    On Potential Fault Detection in Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:142-149 [Conf]
  92. Manish Sharma, Janak H. Patel
    Enhanced delay defect coverage with path-segments. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:385-392 [Conf]
  93. Manish Sharma, Janak H. Patel
    Testing of critical paths for delay faults. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:634-641 [Conf]
  94. Manish Sharma, Janak H. Patel
    Finding a Small Set of Longest Testable Paths that Cover Every Gate. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:974-982 [Conf]
  95. Dong Xiang, Janak H. Patel
    A Global Algorithm for the Partial Scan Design Problem Using Circuit State Information. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:548-557 [Conf]
  96. John W. C. Fu, Janak H. Patel, Bob L. Janssens
    Stride directed prefetching in scalar processors. [Citation Graph (0, 0)][DBLP]
    MICRO, 1992, pp:102-110 [Conf]
  97. Dilip Krishnaswamy, Prithviraj Banerjee, Elizabeth M. Rudnick, Janak H. Patel
    Asynchronous Parallel Algorithms for Test Set Partitioned Fault Simulation. [Citation Graph (0, 0)][DBLP]
    Workshop on Parallel and Distributed Simulation, 1997, pp:30-37 [Conf]
  98. Mohammad Malkawi, Janak H. Patel
    Compiler Directed Memory Management Policy For Numerical Programs. [Citation Graph (0, 0)][DBLP]
    SOSP, 1985, pp:97-106 [Conf]
  99. Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal
    Improving accuracy in path delay fault coverage estimation. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1996, pp:422-425 [Conf]
  100. Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal
    A Test Generator for Segment Delay Faults. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1999, pp:484-491 [Conf]
  101. Charles R. Graham, Elizabeth M. Rudnick, Janak H. Patel
    Dynamic Fault Grouping for PROOFS: A Win for Large Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1997, pp:542-544 [Conf]
  102. Michael S. Hsiao, Gurjeet S. Saund, Elizabeth M. Rudnick, Janak H. Patel
    Partial Scan Selection Based on Dynamic Reachability and Observability Information. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1998, pp:174-180 [Conf]
  103. Zbigniew Kalbarczyk, Janak H. Patel, Myeong S. Lee, Ravishankar K. Iyer
    An Approach to Evaluating the Effects of Realistic Faults in Digital Circuits. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1999, pp:260-265 [Conf]
  104. Dilip Krishnaswamy, Michael S. Hsiao, Vikram Saxena, Elizabeth M. Rudnick, Janak H. Patel, Prithviraj Banerjee
    Parallel Genetic Algorithms for Simulation-Based Sequential Circuit Test Generation. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1997, pp:475-481 [Conf]
  105. Elizabeth M. Rudnick, Janak H. Patel
    A genetic approach to test application time reduction for full scan and partial scan circuits. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1995, pp:288-293 [Conf]
  106. Elizabeth M. Rudnick, Janak H. Patel
    Overcoming the Serial Logic Simulation Bottleneck in Parallel Fault Simulation. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1997, pp:495-503 [Conf]
  107. Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel
    Diagnostic Simulation of Sequential Circuits Using Fault Sampling. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1998, pp:476-481 [Conf]
  108. Jian-Kun Zhao, Jeffrey A. Newquist, Janak H. Patel
    A Graph Traversal Based Framework For Sequential Logic Implication With An Application To C-Cycle Redundancy Identification. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2001, pp:163-0 [Conf]
  109. Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel
    Cyclic stress tests for full scan circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 1995, pp:89-94 [Conf]
  110. Ilker Hamzaoglu, Janak H. Patel
    Reducing Test Application Time for Built-in-Self-Test Test Pattern Generators. [Citation Graph (0, 0)][DBLP]
    VTS, 2000, pp:369-376 [Conf]
  111. Ilker Hamzaoglu, Janak H. Patel
    New Techniques for Deterministic Test Pattern Generation. [Citation Graph (0, 0)][DBLP]
    VTS, 1998, pp:446-452 [Conf]
  112. Ismed Hartanto, Vamsi Boppana, Janak H. Patel, W. Kent Fuchs
    Diagnostic Test Pattern Generation for Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:196-202 [Conf]
  113. Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal
    Segment delay faults: a new fault model. [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:32-41 [Conf]
  114. Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
    Automatic test generation using genetically-engineered distinguishing sequences. [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:216-223 [Conf]
  115. Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
    Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:188-195 [Conf]
  116. Frank F. Hsu, Janak H. Patel
    A distance reduction approach to design for testability. [Citation Graph (0, 0)][DBLP]
    VTS, 1995, pp:158-163 [Conf]
  117. Dilip Krishnaswamy, Elizabeth M. Rudnick, Janak H. Patel, Prithviraj Banerjee
    SPITFIRE: scalable parallel algorithms for test set partitioned fault simulation. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:274-281 [Conf]
  118. Liyang Lai, Thomas Rinderknecht, Wu-Tung Cheng, Janak H. Patel
    Logic BIST Using Constrained Scan Cells. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:199-205 [Conf]
  119. Terry Lee, Ibrahim N. Hajj, Elizabeth M. Rudnick, Janak H. Patel
    Genetic-algorithm-based test generation for current testing of bridging faults in CMOS VLSI circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:456-462 [Conf]
  120. Amit R. Pandey, Janak H. Patel
    Reconfiguration Technique for Reducing Test Time and Test Data Volume in Illinois Scan Architecture Based Designs . [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:9-15 [Conf]
  121. Janak H. Patel, Steven S. Lumetta, Sudhakar M. Reddy
    Application of Saluja-Karpovsky Compactors to Test Responses with Many Unknowns. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:107-112 [Conf]
  122. Manish Sharma, Janak H. Patel
    Bounding Circuit Delay by Testing a Very Small Subset of Paths. [Citation Graph (0, 0)][DBLP]
    VTS, 2000, pp:333-342 [Conf]
  123. Manish Sharma, Janak H. Patel
    What Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit? [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:31-36 [Conf]
  124. Manish Sharma, Janak H. Patel, Jeff Rearick
    Test Data Compression and Test Time Reduction of Longest-Path-Per-Gate Tests based on Illinois Scan Architecture. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:15-21 [Conf]
  125. Jian-Kun Zhao, Elizabeth M. Rudnick, Janak H. Patel
    Static logic implication with application to redundancy identification. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:288-295 [Conf]
  126. Hungse Cha, Elizabeth M. Rudnick, Janak H. Patel, Ravishankar K. Iyer, Gwan S. Choi
    A Gate-Level Simulation Environment for Alpha-Particle-Induced Transient Faults. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1996, v:45, n:11, pp:1248-1256 [Journal]
  127. Ming-Feng Chang, W. Kent Fuchs, Janak H. Patel
    Diagnosis and Repair of Memory with Coupling Faults. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1989, v:38, n:4, pp:493-500 [Journal]
  128. Wu-Tung Cheng, Janak H. Patel
    A Minimum Test Set for Multiple Fault Detection in Ripple Carry Adders. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1987, v:36, n:7, pp:891-895 [Journal]
  129. Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
    Fast Static Compaction Algorithms for Sequential Circuit Test Vectors. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1999, v:48, n:3, pp:311-322 [Journal]
  130. Subhasis Laha, Janak H. Patel, Ravishankar K. Iyer
    Accurate Low-Cost Methods for Performance Evaluation of Cache Memory Systems. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1988, v:37, n:11, pp:1325-1336 [Journal]
  131. Pinaki Mazumder, Janak H. Patel
    Parallel Testing for Pattern-Sensitive Faults in Semiconductor Random-Access Memories. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1989, v:38, n:3, pp:394-407 [Journal]
  132. Janak H. Patel
    An Alternative to the Distributed Pipeline. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1980, v:29, n:8, pp:736-737 [Journal]
  133. Janak H. Patel
    Performance of Processor-Memory Interconnections for Multiprocessors. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1981, v:30, n:10, pp:771-780 [Journal]
  134. Janak H. Patel
    Analysis of Multiprocessors with Private Cache Memories. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1982, v:31, n:4, pp:296-304 [Journal]
  135. Janak H. Patel, Leona Y. Fung
    Concurrent Error Detection in ALU's by Recomputing with Shifted Operands. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1982, v:31, n:7, pp:589-595 [Journal]
  136. Janak H. Patel, Leona Y. Fung
    Concurrent Error Detection in Multiply and Divide Arrays. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1983, v:32, n:4, pp:417-422 [Journal]
  137. Elizabeth M. Rudnick, Janak H. Patel
    Efficient Techniques for Dynamic Test Sequence Compaction. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1999, v:48, n:3, pp:323-330 [Journal]
  138. Dong Xiang, Janak H. Patel
    Partial Scan Design Based on Circuit State Information and Functional Analysis. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 2004, v:53, n:3, pp:276-287 [Journal]
  139. Phil C. C. Yeh, Janak H. Patel, Edward S. Davidson
    Shared Cache for Multiple-Stream Computer Systems. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1983, v:32, n:1, pp:38-47 [Journal]
  140. Susheel J. Chandra, Janak H. Patel
    Experimental evaluation of testability measures for test generation (logic circuits). [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1989, v:8, n:1, pp:93-97 [Journal]
  141. Vivek Chickermane, Jaushin Lee, Janak H. Patel
    Addressing design for testability at the architectural level. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1994, v:13, n:7, pp:920-934 [Journal]
  142. Ilker Hamzaoglu, Janak H. Patel
    Test set compaction algorithms for combinational circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2000, v:19, n:8, pp:957-963 [Journal]
  143. Keerthi Heragu, Vishwani D. Agrawal, Michael L. Bushnell, Janak H. Patel
    Improving a nonenumerative method to estimate path delay fault coverage. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1997, v:16, n:7, pp:759-762 [Journal]
  144. Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
    Application of genetically engineered finite-state-machine sequences to sequential circuit ATPG. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1998, v:17, n:3, pp:239-254 [Journal]
  145. Jaushin Lee, Janak H. Patel
    Architectural level test generation for microprocessors. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1994, v:13, n:10, pp:1288-1300 [Journal]
  146. Jaushin Lee, Janak H. Patel
    Hierarchical test generation under architectural level functional constraints. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1996, v:15, n:9, pp:1144-1151 [Journal]
  147. Pinaki Mazumder, Janak H. Patel, W. Kent Fuchs
    Methodologies for testing embedded content addressable memories. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1988, v:7, n:1, pp:11-20 [Journal]
  148. Thomas M. Niermann, Wu-Tung Cheng, Janak H. Patel
    PROOFS: a fast, memory-efficient sequential circuit fault simulator. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1992, v:11, n:2, pp:198-207 [Journal]
  149. Thomas M. Niermann, Rabindra K. Roy, Janak H. Patel, Jacob A. Abraham
    Test compaction for sequential circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1992, v:11, n:2, pp:260-267 [Journal]
  150. Elizabeth M. Rudnick, Vivek Chickermane, Janak H. Patel
    An observability enhancement approach for improved testability and at-speed test. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1994, v:13, n:8, pp:1051-1056 [Journal]
  151. Elizabeth M. Rudnick, Janak H. Patel, Gary S. Greenstein, Thomas M. Niermann
    A genetic algorithm framework for test generation. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1997, v:16, n:9, pp:1034-1044 [Journal]
  152. Ismed Hartanto, Srikanth Venkataraman, W. Kent Fuchs, Elizabeth M. Rudnick, Janak H. Patel, Sreejit Chakravarty
    Diagnostic simulation of stuck-at faults in sequential circuits using compact lists. [Citation Graph (0, 0)][DBLP]
    ACM Trans. Design Autom. Electr. Syst., 2001, v:6, n:4, pp:471-489 [Journal]
  153. Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
    Dynamic state traversal for sequential circuit test generation. [Citation Graph (0, 0)][DBLP]
    ACM Trans. Design Autom. Electr. Syst., 2000, v:5, n:3, pp:548-565 [Journal]
  154. Paul J. Thadikaran, Sreejit Chakravarty, Janak H. Patel
    Algorithms to compute bridging fault coverage of IDDQ test sets. [Citation Graph (0, 0)][DBLP]
    ACM Trans. Design Autom. Electr. Syst., 1997, v:2, n:3, pp:281-305 [Journal]
  155. Alok N. Choudhary, Janak H. Patel, Narendra Ahuja
    NETRA: A Hierarchical and Partitionable Architecture for Computer Vision Systems. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Parallel Distrib. Syst., 1993, v:4, n:10, pp:1092-1104 [Journal]
  156. Kun-Lung Wu, W. Kent Fuchs, Janak H. Patel
    Error Recovery in Shared Memory Multiprocessors Using Private Caches. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Parallel Distrib. Syst., 1990, v:1, n:2, pp:231-240 [Journal]
  157. Elizabeth M. Rudnick, Vivek Chickermane, Prithviraj Banerjee, Janak H. Patel
    Sequential circuit testability enhancement using a nonscan approach. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 1995, v:3, n:2, pp:333-338 [Journal]
  158. Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
    Peak power estimation of VLSI circuits: new peak power measures. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2000, v:8, n:4, pp:435-439 [Journal]

  159. Sequential circuit test generation using dynamic state traversal. [Citation Graph (, )][DBLP]


  160. PROOFS: a super fast fault simulator for sequential circuits. [Citation Graph (, )][DBLP]


  161. A performance model for instruction prefetch in pipelined instruction units. [Citation Graph (, )][DBLP]


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