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Masahiro Ichimiya: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada
    CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:117-122 [Conf]
  2. Masaki Hashizume, Yukiya Miura, Masahiro Ichimiya, Takeomi Tamesada, Kozo Kinoshita
    A High-Speed IDDQ Sensor for Low-Voltage ICs. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1998, pp:327-0 [Conf]
  3. Masaki Hashizume, Hiroyuki Yotsuyanagi, Masahiro Ichimiya, Takeomi Tamesada, Masashi Takeda
    High speed IDDQ test and its testability for process variation. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2000, pp:344-349 [Conf]
  4. Teppei Takeda, Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Yukiya Miura, Kozo Kinoshita
    IDDQ Sensing Technique for High Speed IDDQ Testing. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:111-116 [Conf]
  5. Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada
    CMOS open defect detection by supply current test. [Citation Graph (0, 0)][DBLP]
    DATE, 2001, pp:509- [Conf]
  6. Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada
    Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field. [Citation Graph (0, 0)][DBLP]
    DELTA, 2002, pp:387-391 [Conf]
  7. Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada
    Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field. [Citation Graph (0, 0)][DBLP]
    DFT, 2001, pp:287-0 [Conf]
  8. Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada
    Electric field for detecting open leads in CMOS logic circuits by supply current testing. [Citation Graph (0, 0)][DBLP]
    ISCAS (3), 2005, pp:2995-2998 [Conf]
  9. Masahiro Ichimiya, Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada
    A test circuit for pin shorts generating oscillation in CMOS logic circuits. [Citation Graph (0, 0)][DBLP]
    Systems and Computers in Japan, 2004, v:35, n:13, pp:10-20 [Journal]

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