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Teppei Takeda: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Masaki Hashizume, Teppei Takeda, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura, Kozo Kinoshita
    A BIST Circuit for IDDQ Tests. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2003, pp:390-395 [Conf]
  2. Teppei Takeda, Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Yukiya Miura, Kozo Kinoshita
    IDDQ Sensing Technique for High Speed IDDQ Testing. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:111-116 [Conf]

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