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Publications of Author

1. Zhiyuan He, Gert Jervan, Zebo Peng, Petru Eles
   Hybrid BIST Test Scheduling Based on Defect Probabilities. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2004, pp:230-235 [Conf]
   
2. Zhiyuan He, Zebo Peng, Petru Eles
   Power constrained and defect-probability driven SoC test scheduling with test set partitioning. [Citation Graph (0, 0)][DBLP]
   DATE, 2006, pp:291-296 [Conf]
   
3. Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinger, Bashir M. Al-Hashimi
   Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving. [Citation Graph (0, 0)][DBLP]
   DFT, 2006, pp:477-485 [Conf]
   
4. Zhiyuan He, Gert Jervan, Zebo Peng, Petru Eles
   Power-Constrained Hybrid BIST Test Scheduling in an Abort-on-First-Fail Test Environment. [Citation Graph (0, 0)][DBLP]
   DSD, 2005, pp:83-87 [Conf]
   
5. 
   Multi-temperature testing for core-based system-on-chip. [Citation Graph (, )][DBLP]
   
   
6. 
   Thermal-Aware Test Scheduling for Core-Based SoC in an Abort-on-First-Fail Test Environment. [Citation Graph (, )][DBLP]