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Sam D. Huynh:
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Publications of Author
- Sam D. Huynh, Seongwon Kim, Mani Soma, Jinyan Zhang
Dynamic Test Set Generation for Analog Circuits and Systems. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 1998, pp:360-365 [Conf]
- Sam D. Huynh, Jinyan Zhang, Seongwon Kim, Giri Devarayanadurg, Mani Soma
Efficient Test Set Design for Analog and Mixed-Signal Circuits and Systems. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 1999, pp:239-0 [Conf]
- Sam D. Huynh, Seongwon Kim, Mani Soma, Jinyan Zhang
Testability analysis and multi-frequency ATPG for analog circuits and systems. [Citation Graph (0, 0)][DBLP] ICCAD, 1998, pp:376-383 [Conf]
- Jinyan Zhang, Sam D. Huynh, Mani Soma
A Test Point Insertion Algorithm for Mixed-Signal Circuits. [Citation Graph (0, 0)][DBLP] VTS, 1999, pp:319-325 [Conf]
- Mani Soma, Sam D. Huynh, Jinyan Zhang, Seongwon Kim, Giri Devarayanadurg
Hierarchical ATPG for Analog Circuits and Systems. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:1, pp:72-81 [Journal]
- Giri Devarayanadurg, Mani Soma, Prashant Goteti, Sam D. Huynh
Test set selection for structural faults in analog IC's. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:7, pp:1026-1039 [Journal]
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