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Takeshi Asakawa: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Kenichi Ichino, Takeshi Asakawa, Satoshi Fukumoto, Kazuhiko Iwasaki, Seiji Kajihara
    Hybrid BIST Using Partially Rotational Scan. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:379-384 [Conf]
  2. Takeshi Asakawa, Kazuhiko Iwasaki
    Using ATPG vectors for BIST test pattern generator. [Citation Graph (0, 0)][DBLP]
    Systems and Computers in Japan, 2001, v:32, n:11, pp:1-8 [Journal]
  3. Takeshi Asakawa, Kazuhiko Iwasaki, Seiji Kajihara
    BIST-oriented test pattern generator for detection of transition faults. [Citation Graph (0, 0)][DBLP]
    Systems and Computers in Japan, 2003, v:34, n:3, pp:76-84 [Journal]

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