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Armagan Akar: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Kazuhiko Iijima, Armagan Akar, Charlie McDonald, Dwayne Burek
    Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2002, pp:311-316 [Conf]

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