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Dwayne Burek: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Kazuhiko Iijima, Armagan Akar, Charlie McDonald, Dwayne Burek
    Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2002, pp:311-316 [Conf]
  2. Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan
    ScanBIST: A Multi-frequency Scan-based BIST Method. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:506-513 [Conf]
  3. R. Dean Adams, Robert Abbott, Xiaoliang Bai, Dwayne Burek, Eric MacDonald
    An Integrated Memory Self Test and EDA Solution. [Citation Graph (0, 0)][DBLP]
    MTDT, 2004, pp:92-95 [Conf]
  4. Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti
    IP and Automation to Support IEEE P1500. [Citation Graph (0, 0)][DBLP]
    VTS, 2001, pp:411-412 [Conf]
  5. Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan
    ScanBist: A Multifrequency Scan-Based BIST Method. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1994, v:11, n:1, pp:7-17 [Journal]

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