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Sunghoon Chun: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Jung-Been Im, Sunghoon Chun, Geunbae Kim, Jin-Ho Ahn, Sungho Kang
    RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:242-247 [Conf]
  2. YongJoon Kim, DongSub Song, YongSeung Shin, Sunghoon Chun, Sungho Kang
    A New Maximal Diagnosis Algorithm for Bus-structured Systems. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:349-357 [Conf]
  3. Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang
    MICRO: a new hybrid test data compression/decompression scheme. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2006, v:14, n:6, pp:649-654 [Journal]
  4. Sunghoon Chun, Sangwook Kim, Hong-Sik Kim, Sungho Kang
    An Efficient Dictionary Organization for Maximum Diagnosis. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2006, v:22, n:1, pp:37-48 [Journal]
  5. Sunghoon Chun, YongJoon Kim, Sungho Kang
    MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2007, v:23, n:4, pp:357-362 [Journal]

  6. A new low energy BIST using a statistical code. [Citation Graph (, )][DBLP]

  7. An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation. [Citation Graph (, )][DBLP]

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