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Sunghoon Chun:
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- Jung-Been Im, Sunghoon Chun, Geunbae Kim, Jin-Ho Ahn, Sungho Kang
RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2004, pp:242-247 [Conf]
- YongJoon Kim, DongSub Song, YongSeung Shin, Sunghoon Chun, Sungho Kang
A New Maximal Diagnosis Algorithm for Bus-structured Systems. [Citation Graph (0, 0)][DBLP] ITC, 2003, pp:349-357 [Conf]
- Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang
MICRO: a new hybrid test data compression/decompression scheme. [Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2006, v:14, n:6, pp:649-654 [Journal]
- Sunghoon Chun, Sangwook Kim, Hong-Sik Kim, Sungho Kang
An Efficient Dictionary Organization for Maximum Diagnosis. [Citation Graph (0, 0)][DBLP] J. Electronic Testing, 2006, v:22, n:1, pp:37-48 [Journal]
- Sunghoon Chun, YongJoon Kim, Sungho Kang
MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs. [Citation Graph (0, 0)][DBLP] J. Electronic Testing, 2007, v:23, n:4, pp:357-362 [Journal]
A new low energy BIST using a statistical code. [Citation Graph (, )][DBLP]
An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation. [Citation Graph (, )][DBLP]
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