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Kenji Noda: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Michiko Inoue, Takeshi Higashimura, Kenji Noda, Toshimitsu Masuzawa, Hideo Fujiwara
    A High-Level Synthesis Method for Weakly Testable Data Paths. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1998, pp:40-45 [Conf]

  2. Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. [Citation Graph (, )][DBLP]


  3. A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. [Citation Graph (, )][DBLP]


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