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Noriyoshi Itazaki :
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Noriyoshi Itazaki , Yasutaka Idomoto , Kozo Kinoshita An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 1997, pp:22-0 [Conf ] Noriyoshi Itazaki , Fumiro Matsuki , Yasuyuki Matsumoto , Kozo Kinoshita Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 1998, pp:272-277 [Conf ] Kazuya Shimizu , Noriyoshi Itazaki , Kozo Kinoshita Built-in Self-Test for State Faults Induced by Crosstalk in Sequential Circuits. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 2001, pp:469- [Conf ] Kazuya Shimizu , Noriyoshi Itazaki , Kozo Kinoshita Crosstalk Fault Reduction and Simulation for Clock-Delayed Domino Circuits. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 2002, pp:176-181 [Conf ] Kazuya Shimizu , Masaya Takamura , Takanori Shirai , Noriyoshi Itazaki , Kozo Kinoshita Fault Simulation Method for Crosstalk Faults in Clock-Delayed Domino CMOS Circuits. [Citation Graph (0, 0)][DBLP ] DELTA, 2002, pp:92-98 [Conf ] Noriyoshi Itazaki , Yasutaka Idomoto , Kozo Kinoshita A Fault Simulation Method for Crosstalk Faults in Synchronous Sequential Circuits. [Citation Graph (0, 0)][DBLP ] FTCS, 1996, pp:38-43 [Conf ] Noriyoshi Itazaki , Kozo Kinoshita Test Pattern Generation for Circuits with Three-state Modules by Improved Z-algorithm. [Citation Graph (0, 0)][DBLP ] ITC, 1986, pp:105-112 [Conf ] Kazuya Shimizu , Noriyoshi Itazaki , Kozo Kinoshita Built-in Self-Test for crosstalk faults in a digital VLSI. [Citation Graph (0, 0)][DBLP ] Systems and Computers in Japan, 2002, v:33, n:13, pp:35-47 [Journal ] Noriyoshi Itazaki , Kozo Kinoshita Test pattern generation for circuits with tri-state modules by Z-algorithm. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1989, v:8, n:12, pp:1327-1334 [Journal ] Antonio Rubio , Noriyoshi Itazaki , Xiaole Xu , Kozo Kinoshita An approach to the analysis and detection of crosstalk faults in digital VLSI circuits. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1994, v:13, n:3, pp:387-395 [Journal ] Search in 0.002secs, Finished in 0.002secs