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Phil Nigh: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Vikram Iyengar, Phil Nigh
    Defect-Oriented Test for Ultra-Low DPM. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2005, pp:455- [Conf]
  2. Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh
    Binning for IC Quality: Experimental Studies on the SEMATECH Data. [Citation Graph (0, 0)][DBLP]
    DFT, 1998, pp:4-10 [Conf]
  3. Daniel R. Knebel, Pia Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika
    Diagnosis and characterization of timing-related defects by time-dependent light emission. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:733-739 [Conf]
  4. Phil Nigh
    Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1198- [Conf]
  5. Phil Nigh
    The Increasing Importance of On-line Testing to Ensure High-Reliability Products. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:1281- [Conf]
  6. Phil Nigh
    Achieving Quality Levels of 100dpm: It's possible - but roll up your sleeves and be prepared to do some work.. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:1420- [Conf]
  7. Phil Nigh
    Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization". [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:1429- [Conf]
  8. Phil Nigh
    SIA Roadmap: test must not limit future technologies. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:1152- [Conf]
  9. Phil Nigh, Donato Forlenza, Franco Motika
    Application and Analysis of IDDQ Diagnostic Software. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:319-327 [Conf]
  10. Phil Nigh, Anne E. Gattiker
    Test method evaluation experiments and data. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:454-463 [Conf]
  11. Phil Nigh, Anne E. Gattiker
    Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:309-318 [Conf]
  12. Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly
    So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:1037-1038 [Conf]
  13. Phil Nigh, David P. Vallett, Atul Patel, Jason Wright
    Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:43-0 [Conf]
  14. Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato Forlenza, Ray Kurtulik, Wendy Chong
    Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:1152-1161 [Conf]
  15. Adit D. Singh, Phil Nigh, C. Mani Krishna
    Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:362-369 [Conf]
  16. Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix
    ASIC Test Cost/Strategy Trade-offs. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:93-102 [Conf]
  17. Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken
    An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:459- [Conf]
  18. Robert C. Aitken, J. Hutcheson, N. Murthy, Phil Nigh, Nicholas Sporck
    Volume Manufacturing - ICs and Boards: DFT to the Rescue? [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:212-213 [Conf]
  19. Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh
    Best Methods for At-Speed Testing? [Citation Graph (0, 0)][DBLP]
    VTS, 1998, pp:460-461 [Conf]
  20. Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers
    Debating the Future of Burn-In. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:311-314 [Conf]
  21. Phil Nigh
    Session Abstract. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:44- [Conf]
  22. Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh
    MINVDD Testing for Weak CMOS ICs. [Citation Graph (0, 0)][DBLP]
    VTS, 2001, pp:339-345 [Conf]
  23. Phil Nigh
    Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:2, pp:86-87 [Journal]
  24. Phil Nigh, Wojciech Maly
    Test Generation for Current Testing (CMOS ICs). [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1990, v:7, n:1, pp:26-38 [Journal]

  25. The Evolving Role of Test ... it is now a "Value Add" Operation. [Citation Graph (, )][DBLP]


  26. How Many Test Patterns are Useless? [Citation Graph (, )][DBLP]


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