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Jay Jahangiri: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Jay Jahangiri, Nilanjan Mukherjee, Wu-Tung Cheng, Subramanian Mahadevan, Ron Press
    Achieving High Test Quality with Reduced Pin Count Testing. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2005, pp:312-317 [Conf]
  2. Jay Jahangiri, David Abercrombie
    Meeting Nanometer DPM Requirements Through DFT. [Citation Graph (0, 0)][DBLP]
    ISQED, 2005, pp:276-282 [Conf]
  3. Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware
    Silicon Evaluation of Static Alternative Fault Models. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:265-270 [Conf]
  4. Jay Jahangiri, David Abercrombie
    Value-Added Defect Testing Techniques. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:224-231 [Journal]
  5. Ron Press, Jay Jahangiri
    The Demand and Practical Approach for 100x Test Compression. [Citation Graph (0, 0)][DBLP]
    VLSI-SoC, 2006, pp:245-250 [Conf]

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