The SCEAS System
Navigation Menu

Search the dblp DataBase

Title:
Author:

Najmi T. Jarwala: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Najmi T. Jarwala, Paul W. Rutkowski, Shianling Wu, Chi W. Yau
    Lessons Learned from Practical Applications of BIST/B-S Technology. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1996, pp:251-257 [Conf]
  2. Najmi T. Jarwala
    Designing "Dual-Personality" IEEE 1149.1-Compliant Multi-Chip Modules. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:446-455 [Conf]
  3. Najmi T. Jarwala, Paul Stiling, Enn Tammaru, Chi W. Yau
    A Framework for Boundary-Scan Based System Test Diagnosis. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:993-998 [Conf]
  4. Najmi T. Jarwala, Chi W. Yau
    A New Framework for Analyzing Test Generation and Diagnosis Algorithms for Wiring Interconnects. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:63-70 [Conf]
  5. Najmi T. Jarwala, Chi W. Yau
    A Unified Theory for Designing Optimal Test Generation and Diagnosis Algorithms for Board Interconnects. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:71-77 [Conf]
  6. Najmi T. Jarwala, Chi W. Yau
    Achieving Board-Level BIST Using the Boundary-Scan Master. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:649-658 [Conf]
  7. Wuudiann Ke, Duy Le, Najmi T. Jarwala
    A Secure Data Transmission Scheme for 1149.1 Backplane Test Bus. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:789-796 [Conf]
  8. J. El-Ziq, Najmi T. Jarwala, Niraj K. Jha, Peter Marwedel, Christos A. Papachristou, Janusz Rajski, John W. Sheppard
    Hardware-Software Co-Design for Test: It's the Last Straw! [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:506-507 [Conf]
  9. Bernd Könemann, Ben Bennetts, Najmi T. Jarwala, Benoit Nadeau-Dostie
    Built-In Self-Test: Assuring System Integrity. [Citation Graph (0, 0)][DBLP]
    IEEE Computer, 1996, v:29, n:11, pp:39-45 [Journal]
  10. Najmi T. Jarwala, Dhiraj K. Pradhan
    TRAM: A Design Methodology for High-Performance, Easily Testable, Multimegabit RAM's. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1988, v:37, n:10, pp:1235-1250 [Journal]

Search in 0.001secs, Finished in 0.002secs
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002