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Chi W. Yau: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Najmi T. Jarwala, Paul W. Rutkowski, Shianling Wu, Chi W. Yau
    Lessons Learned from Practical Applications of BIST/B-S Technology. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1996, pp:251-257 [Conf]
  2. Anton T. Dahbura, M. Ümit Uyar, Chi W. Yau
    An Optimal Test Sequence for the JTAG/IEEE P1149.1 Test Access Port Controller. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:55-62 [Conf]
  3. Najmi T. Jarwala, Paul Stiling, Enn Tammaru, Chi W. Yau
    A Framework for Boundary-Scan Based System Test Diagnosis. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:993-998 [Conf]
  4. Najmi T. Jarwala, Chi W. Yau
    A New Framework for Analyzing Test Generation and Diagnosis Algorithms for Wiring Interconnects. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:63-70 [Conf]
  5. Najmi T. Jarwala, Chi W. Yau
    A Unified Theory for Designing Optimal Test Generation and Diagnosis Algorithms for Board Interconnects. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:71-77 [Conf]
  6. Najmi T. Jarwala, Chi W. Yau
    Achieving Board-Level BIST Using the Boundary-Scan Master. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:649-658 [Conf]
  7. Chi W. Yau
    Concurrent Test Generation Using AI Techniques. [Citation Graph (0, 0)][DBLP]
    ITC, 1986, pp:722-731 [Conf]
  8. Chi W. Yau, Song-Lin Chang, Bruce F. Jordan, Joe J. Schwermann, Joan A. Wellman
    Trouble-Shooting: A Key to Process Improvement. [Citation Graph (0, 0)][DBLP]
    ITC, 1988, pp:796-803 [Conf]

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