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Atsushi Murakami: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Seiji Kajihara, Atsushi Murakami, Tomohisa Kaneko
    On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1999, pp:20-24 [Conf]
  2. Atsushi Murakami, Seiji Kajihara, Tsutomu Sasao, Irith Pomeranz, Sudhakar M. Reddy
    Selection of potentially testable path delay faults for test generation. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:376-384 [Conf]
  3. T. Noguchi, Atsushi Murakami, Masato Kawai, Y. Hayasaka
    Testing for a Solid-State Color Image Sensor. [Citation Graph (0, 0)][DBLP]
    ITC, 1986, pp:683-687 [Conf]
  4. Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara, Atsushi Murakami, Sadami Takeoka, Mitsuyasu Ohta
    On validating data hold times for flip-flops in sequential circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:317-325 [Conf]

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