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Kohei Miyase: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Seiji Kajihara, Kenjiro Taniguchi, Kohei Miyase, Irith Pomeranz, Sudhakar M. Reddy
    Test Data Compression Using Don?t-Care Identification and Statistical Encoding. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2002, pp:67-0 [Conf]
  2. Kohei Miyase, Seiji Kajihara
    Optimal Scan Tree Construction with Test Vector Modification for Test Compression. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2003, pp:136-141 [Conf]
  3. Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy
    Multiple Scan Tree Design with Test Vector Modification. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:76-81 [Conf]
  4. Kohei Miyase, Kenta Terashima, Seiji Kajihara, Xiaoqing Wen, Sudhakar M. Reddy
    On Improving Defect Coverage of Stuck-at Fault Tests. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2005, pp:216-223 [Conf]
  5. Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy
    A Method of Static Test Compaction Based on Don't Care Identification. [Citation Graph (0, 0)][DBLP]
    DELTA, 2002, pp:392-395 [Conf]
  6. Seiji Kajihara, Kohei Miyase
    On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits. [Citation Graph (0, 0)][DBLP]
    ICCAD, 2001, pp:364-369 [Conf]
  7. Kohei Miyase, Seiji Kajihara, Irith Pomeranz, Sudhakar M. Reddy
    Don't-Care Identification on Specific Bits of Test Patterns. [Citation Graph (0, 0)][DBLP]
    ICCD, 2002, pp:194-199 [Conf]
  8. Seiji Kajihara, Koji Ishida, Kohei Miyase
    Test Vector Modification for Power Reduction during Scan Testing. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:160-165 [Conf]
  9. Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz
    On Test Data Volume Reduction for Multiple Scan Chain Designs. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:103-110 [Conf]
  10. Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Khader S. Abdel-Hafez, Kozo Kinoshita
    A New ATPG Method for Efficient Capture Power Reduction During Scan Testing. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:58-65 [Conf]
  11. Kohei Miyase, Seiji Kajihara
    XID: Don't care identification of test patterns for combinational circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:2, pp:321-326 [Journal]
  12. Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz
    On test data volume reduction for multiple scan chain designs. [Citation Graph (0, 0)][DBLP]
    ACM Trans. Design Autom. Electr. Syst., 2003, v:8, n:4, pp:460-469 [Journal]
  13. Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja
    Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. [Citation Graph (0, 0)][DBLP]
    DAC, 2007, pp:527-532 [Conf]
  14. Xiaoqing Wen, Tatsuya Suzuki, Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Laung-Terng Wang, Kewal K. Saluja
    Efficient Test Set Modification for Capture Power Reduction. [Citation Graph (0, 0)][DBLP]
    J. Low Power Electronics, 2005, v:1, n:3, pp:319-330 [Journal]

  15. CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing. [Citation Graph (, )][DBLP]


  16. Diagnosis of Realistic Defects Based on the X-Fault Model. [Citation Graph (, )][DBLP]


  17. Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. [Citation Graph (, )][DBLP]


  18. A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. [Citation Graph (, )][DBLP]


  19. Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. [Citation Graph (, )][DBLP]


  20. A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing. [Citation Graph (, )][DBLP]


  21. On estimation of NBTI-Induced delay degradation. [Citation Graph (, )][DBLP]


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