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Emmanouil Kalligeros: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos
    A ROMless LFSR Reseeding Scheme for Scan-based BIST. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2002, pp:206-0 [Conf]
  2. Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos
    Efficient test-data compression for IP cores using multilevel Huffman coding. [Citation Graph (0, 0)][DBLP]
    DATE, 2006, pp:1033-1038 [Conf]
  3. Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos
    A highly regular multi-phase reseeding technique for scan-based BIST. [Citation Graph (0, 0)][DBLP]
    ACM Great Lakes Symposium on VLSI, 2003, pp:295-298 [Conf]
  4. Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos
    A New Reseeding Technique for LFSR-Based Test Pattern Generation. [Citation Graph (0, 0)][DBLP]
    IOLTW, 2001, pp:80-86 [Conf]
  5. Dimitris Bakalis, Dimitris Nikolos, George Alexiou, Emmanouil Kalligeros, Haridimos T. Vergos
    Low Power BIST for Wallace Tree-Based Fast Multipliers. [Citation Graph (0, 0)][DBLP]
    ISQED, 2000, pp:433-438 [Conf]
  6. Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos
    An Efficient Seeds Selection Method for LFSR-Based Test-per-Clock BIST. [Citation Graph (0, 0)][DBLP]
    ISQED, 2002, pp:261-266 [Conf]
  7. Emmanouil Kalligeros, D. Kaseridis, Xrysovalantis Kavousianos, Dimitris Nikolos
    Reseeding-Based Test Set Embedding with Reduced Test Sequences. [Citation Graph (0, 0)][DBLP]
    ISQED, 2005, pp:226-231 [Conf]
  8. Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos
    Efficient Multiphase Test Set Embedding for Scan-based Testing. [Citation Graph (0, 0)][DBLP]
    ISQED, 2006, pp:433-438 [Conf]
  9. Dimitris Bakalis, Emmanouil Kalligeros, Dimitris Nikolos, Haridimos T. Vergos, George Alexiou
    On the design of low power BIST for multipliers with Booth encoding and Wallace tree summation. [Citation Graph (0, 0)][DBLP]
    Journal of Systems Architecture, 2002, v:48, n:4-5, pp:125-135 [Journal]
  10. Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos
    Multiphase BIST: a new reseeding technique for high test-data compression. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:10, pp:1429-1446 [Journal]
  11. Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos
    Optimal Selective Huffman Coding for Test-Data Compression. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 2007, v:56, n:8, pp:1146-1152 [Journal]

  12. State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores. [Citation Graph (, )][DBLP]


  13. LFSR-based test-data compression with self-stoppable seeds. [Citation Graph (, )][DBLP]


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