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Bernd Koenemann: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Bernd Koenemann
    STAGE: A Decoding Engine Suitable for Multi-Compressed Test Data. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2003, pp:142-147 [Conf]
  2. Bernd Koenemann
    Design/process learning from electrical test. [Citation Graph (0, 0)][DBLP]
    ICCAD, 2004, pp:733-738 [Conf]
  3. Bernd Koenemann
    Test In the Era of "What You see Is NOT What You Get". [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:12- [Conf]
  4. David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman
    DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2006, pp:14- [Conf]
  5. Bill Bottoms, Jim Chung, Bernd Koenemann, Glenn Shirley, Lisa Spainhower
    Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue. [Citation Graph (0, 0)][DBLP]
    VTS, 2001, pp:153-154 [Conf]
  6. D. Cheung, Bernd Koenemann, S. Nishtala, B. West, D. Wu
    ATE for VLSI: What Challenges Lie Ahead? [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:318-319 [Conf]
  7. Bernd Koenemann, J. Monzel, T. Powell, N. Saxena, K. Wagner
    Design Validation: Formal Verification vs. Simulation vs. Functional Testing. [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:364-365 [Conf]
  8. Bernd Koenemann, J. Monzel, T. Powell, N. Saxena, K. Wagner
    BIST: Advantages or Limitations? [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:366-367 [Conf]
  9. Fidel Muradali, Mike Ricchetti, Bart Vermeulen, Bulent I. Dervisoglu, Bob Gottlieb, Bernd Koenemann, C. J. Clark
    Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer? [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:445-446 [Conf]
  10. John A. Darringer, Evan Davidson, David J. Hathaway, Bernd Koenemann, Mark A. Lavin, Joseph K. Morrell, Khalid Rahmat, Wolfgang Roesner, Erich Schanzenbach, Gustavo Tellez, Louise Trevillyan
    EDA in IBM: past, present, and future. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2000, v:19, n:12, pp:1476-1497 [Journal]

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