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Publications of Author

1. Bernd Könemann, Carl Barnhart, Brion L. Keller, Tom Snethen, Owen Farnsworth, Donald L. Wheater
   A SmartBIST Variant with Guaranteed Encoding. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2001, pp:325-0 [Conf]
   
2. Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts
   Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. [Citation Graph (0, 0)][DBLP]
   DATE, 2004, pp:1184-1191 [Conf]
   
3. Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Brion L. Keller, Bernd Könemann, Andrej Ferko
   OPMISR: the foundation for compressed ATPG vectors. [Citation Graph (0, 0)][DBLP]
   ITC, 2001, pp:748-757 [Conf]
   
4. Bill Eklow, Carl Barnhart, Kenneth P. Parker
   IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. [Citation Graph (0, 0)][DBLP]
   ITC, 2002, pp:1056-1065 [Conf]
   
5. Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz
   IEEE 1149.6 - A Practical Perspective. [Citation Graph (0, 0)][DBLP]
   ITC, 2003, pp:494-502 [Conf]
   
6. Vivek Chickermane, Scott Richter, Carl Barnhart
   Integrating Logic BIST in VLSI Designs with Embedded Memories. [Citation Graph (0, 0)][DBLP]
   VTS, 2000, pp:157-164 [Conf]
   
7. Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion L. Keller, David Scott, Bernd Könemann, Takeshi Onodera
   Extending OPMISR beyond 10x Scan Test Efficiency. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2002, v:19, n:5, pp:65-72 [Journal]
   
8. Bill Eklow, Carl Barnhart, Kenneth P. Parker
   IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2003, v:20, n:5, pp:76-83 [Journal]